Showing results 8 to 14 of 14
< previous
Title | Author(s) | Issue Date | |
---|---|---|---|
An improved differential voltage technique for capacitance measurement Journal:Solid State Electronics | 1988 | ||
MEASUREMENT OF GRAIN BOUNDARY PARAMETERS BY LASER-SPOT PHOTOCONDUCTIVITY. Proceeding/Conference:Materials Research Society Symposia Proceedings | 1983 | ||
Measurement of interface states in palladium silicon diodes Journal:Journal of Applied Physics | 1986 | ||
Negative capacitance at metal-semiconductor interfaces Journal:Journal of Applied Physics | 1990 | ||
Photoconductance transient response in polycrystalline silicon Journal:Journal of Applied Physics | 1985 | ||
Reply to "comment on 'negative capacitance at metal-semiconductor interfaces'" [J. Appl. Phys. 70, 1090 (1991)] Journal:Journal of Applied Physics | 1991 | ||
Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces Journal:Surface Science | 1986 |