Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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Degradation measurements using fully processed test transistors in high density plasma reactors for failure analysis Journal:Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | 1997 | ||
A fast multigrid algorithm for mesh deformation Proceeding/Conference:ACM Transactions on Graphics | 2006 | ||
Particle-based simulation of granular materials Proceeding/Conference:Computer Animation, Conference Proceedings | 2005 |