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	Title	Author(s)	Issue Date
	The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening Journal:ACS Nano	Park, S Schultz, T Shin, D Mutz, N Aljarb, A Kang, H Lee, C Li, L Xu, X Tung, V List, E Blumstengel, S Amsalem, S Koch, N	2021

Showing results 1 to 1 of 1