Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Core-level shift of Si nanocrystals embedded in a SiO 2 matrix Journal:Journal of Physical Chemistry B | 2004 | ||
Depth Profiling of Si Oxidation States in Si-Implanted SiO 2 Films by X-Ray Photoelectron Spectroscopy Journal:Japanese Journal of Applied Physics, Part 2: Letters | 2003 |