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	Title	Author(s)	Issue Date
	Electrical properties of ZnO nanorods studied by conductive atomic force microscopy Journal:Journal of Applied Physics	Beinik, I Kratzer, M Wachauer, A Wang, L Lechner, RT Teichert, C Motz, C Anwand, W Brauer, G Chen, XY Hsu, XY Djurišić, AB	2011

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