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Title | Author(s) | Issue Date | |
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Sub-bandgap excited photoluminescence probing of deep defect complexes in GaN doped by Si, Ge and C impurities Journal:Semiconductor Science and Technology | 12-Sep-2024 |
Title | Author(s) | Issue Date | |
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Sub-bandgap excited photoluminescence probing of deep defect complexes in GaN doped by Si, Ge and C impurities Journal:Semiconductor Science and Technology | 12-Sep-2024 |