Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Native and process induced defects in GaN films grown on Si substrates probed using a monoenergetic positron beam Proceeding/Conference:2014 International Workshop on Junction Technology, IWJT 2014 | 2014 | ||
Vacancy clusters introduced by CF<inf>4</inf>-based plasma treatment in GaN probed with a monoenergetic positron beam Journal:Applied Physics Express | 2014 |