Showing results 1 to 3 of 3
| Title | Author(s) | Issue Date | |
|---|---|---|---|
A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 8-Apr-2022 | ||
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 7-Jun-2023 | ||
Optically Controlled Ferroelectric Nanodomains for Logic-in-Memory Photonic Devices with Simplified Structures Journal:IEEE Transactions on Electron Devices | 2021 |