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Browsing by Author Kawanago, T.

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	Title	Author(s)	Issue Date
	Electronic trap characterization of the Sc<inf>2</inf>O<inf>3</inf>La <inf>2</inf>O<inf>3</inf> high- κ gate stack by scanning tunneling microscopy Journal:Applied Physics Letters	Ong, Y. C.Ang, D. S.Pey, K. L.Wang, Z. R.O'Shea, S. J.Tung, C. H.Kawanago, T.Kakushima, K.Iwai, H.	2008

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