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	Title	Author(s)	Issue Date
	Stability, Reliability, and Robustness of GaN Power Devices: A Review Journal:IEEE Transactions on Power Electronics	Kozak, Joseph Peter Zhang, Ruizhe Porter, Matthew Song, Qihao Liu, Jingcun Wang, Bixuan Wang, Rudy Saito, Wataru Zhang, Yuhao	2023

Showing results 1 to 1 of 1