Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Oxide-based RRAM: A novel defect-engineering-based implementation for multilevel data storage Proceeding/Conference:2012 4th IEEE International Memory Workshop, IMW 2012 | 2012 | ||
Oxide-based RRAM: Unified microscopic principle for both unipolar and bipolar switching Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM | 2011 |