Showing results 1 to 3 of 3
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Application of noise to avoid overfitting in TCAD augmented machine learning Proceeding/Conference:International Conference on Simulation of Semiconductor Processes and Devices, SISPAD | 2020 | ||
| 2020 | |||
TCAD-Augmented Machine Learning with and without Domain Expertise Journal:IEEE Transactions on Electron Devices | 2021 |
