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Showing results 1 to 9 of 9

	Title	Author(s)	Issue Date
	1.2-kV Vertical GaN Fin-JFETs: High-Temperature Characteristics and Avalanche Capability Journal:IEEE Transactions on Electron Devices	Liu, Jingcun Xiao, Ming Zhang, Ruizhe Pidaparthi, Subhash Cui, Hao Edwards, Andrew Craven, Michael Baubutr, Lek Drowley, Cliff Zhang, Yuhao	2021
	Breakthrough Short Circuit Robustness Demonstrated in Vertical GaN Fin JFET Journal:IEEE Transactions on Power Electronics	Zhang, Ruizhe Liu, Jingcun Li, Qiang Pidaparthi, Subhash Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022
	Dynamic R<inf>ON</inf>Free 1.2-kV Vertical GaN JFET Journal:IEEE Transactions on Electron Devices	Yang, Xin Zhang, Ruizhe Wang, Bixuan Song, Qihao Walker, Andy Pidaparthi, Subhash Drowley, Cliff Zhang, Yuhao	2024
	Evaluation and MHz Converter Application of 1.2-kV Vertical GaN JFET Journal:IEEE Transactions on Power Electronics	Yang, Xin Zhang, Ruizhe Yang, Qiuzhe Song, Qihao Litchford, Everest Walker, Andy J.Pidaparthi, Subhash Drowley, Cliff Dong, Dong Li, Qiang Zhang, Yuhao	2024
	Evaluation of Dynamic R<inf>ON</inf>, Coss Loss, and Short-Circuit Ruggedness of 650V and 1200V Industrial Vertical GaN JFETs Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs	Yang, Xin Song, Qihao Zhang, Ruizhe Wang, Bixuan Pidaparthi, Subhash Walker, Andy Drowley, Cliff Zhang, Yuhao	2024
	Robust Through-Fin Avalanche in Vertical GaN Fin-JFET with Soft Failure Mode Journal:IEEE Electron Device Letters	Zhang, Ruizhe Liu, Jingcun Li, Qiang Pidaparthi, Subhash Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022
	Surge Current and Avalanche Ruggedness of 1.2-kV Vertical GaN p-n Diodes Journal:IEEE Transactions on Power Electronics	Liu, Jingcun Zhang, Ruizhe Xiao, Ming Pidaparthi, Subhash Cui, Hao Edwards, Andrew Baubutr, Lek Drowley, Cliff Zhang, Yuhao	2021
	Trap-Mediated Avalanche in Large-Area 1.2 kV Vertical GaN p-n Diodes Journal:IEEE Electron Device Letters	Liu, Jingcun Xiao, Ming Zhang, Ruizhe Pidaparthi, Subhash Drowley, Cliff Baubutr, Lek Edwards, Andrew Cui, Hao Coles, Charles Zhang, Yuhao	2020
	Tuning Avalanche Path in Vertical GaN JFETs By Gate Driver Design Journal:IEEE Transactions on Power Electronics	Liu, Jingcun Zhang, Ruizhe Xiao, Ming Pidaparthi, Subhash Cui, Hao Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022

Showing results 1 to 9 of 9