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	Title	Author(s)	Issue Date
	Electrical breakdown response for multiple-gap MEMS structures Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Strong, FW Skinner, JL Talin, AA Dentinger, PM Tien, NC	2006
	Roadmap on emerging hardware and technology for machine learning Journal:Nanotechnology	Berggren, K Xia, Q Likharev, KK Strukov, DB Jiang, H Mikolajick, T Querlioz, D Salinga, M Erickson, JR Pi, S Xiong, F Lin, P Li, C Chen, Y Xiong, S Hoskins, BD Daniels, MW Madhavan, A Liddle, JA McClelland, JJ Yang, Y Rupp, J Nonnenmann, SS Cheng, KT Gong, N Lastras-Montaño, MA Talin, AA Salleo, A Shastri, BJ de Lima, TF Prucnal, P Tait, AN Shen, Y Meng, H Roques-Carmes, C Cheng, Z Bhaskaran, H Jariwala, D Wang, H Shainline, JM Segall, K Yang, JJ Roy, K Datta, S Raychowdhury, A	2020

Showing results 1 to 2 of 2