Showing results 1 to 1 of 1
Title | Author(s) | Issue Date | |
---|---|---|---|
Burnout and gate rupture of power MOS transistors with fission fragments of 252Cf Journal:Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2000 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Burnout and gate rupture of power MOS transistors with fission fragments of 252Cf Journal:Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2000 |