Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Characterizing defects in p–n junctions: an analysis of admittance spectroscopy Journal:Journal of Physics D: Applied Physics | 23-Oct-2025 | ||
Resolving emission rates from overlapping capacitance transients of deep levels in SiC Journal:Journal of Physics D: Applied Physics | 3-Mar-2025 |