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Conference Paper: Phase field simulation of ferroelectrics with cracks
Title | Phase field simulation of ferroelectrics with cracks |
---|---|
Authors | |
Keywords | Crack Domain switching Normal ferroelectric Phase field simulation Relaxor ferroelectric |
Issue Date | 2011 |
Publisher | Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net |
Citation | The 8th International Conference on Fracture and Strength of Solids (FEOFS 2010), Kuala Lumpur, Malaysia, 7-9 June 2010. In Key Engineering Materials, 2011, v. 462-463, p. 710-715 How to Cite? |
Abstract | By employing a dipole defect model, two-dimensional phase field simulations of domain switching in the crack tip vicinity of a crack embedded in a relaxor ferroelectric single crystal, which was subjected to mechanical loading and electric field, have been carried out. The interaction between the dipole defects and crack, the influence of the dipole defect concentration density on the switching process, and the coupling effect of mechanical stress and electric field on domain switching in the vicinity of the crack tip have been studied. Comparing the results obtained from relaxor ferroelectrics with those of normal ferroelectrics, the former showed that, due to the interaction between the dipole defects and crack, polarization switching in the vicinity of the crack tip was suppressed. Moreover, the coupling between applied mechanical stress and electric field can either promote or suppress domain switching in the vicinity of a crack. © (2011) Trans Tech Publications. |
Persistent Identifier | http://hdl.handle.net/10722/126288 |
ISSN | 2023 SCImago Journal Rankings: 0.172 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhao, XF | en_HK |
dc.contributor.author | Soh, AK | en_HK |
dc.date.accessioned | 2010-10-31T12:20:12Z | - |
dc.date.available | 2010-10-31T12:20:12Z | - |
dc.date.issued | 2011 | en_HK |
dc.identifier.citation | The 8th International Conference on Fracture and Strength of Solids (FEOFS 2010), Kuala Lumpur, Malaysia, 7-9 June 2010. In Key Engineering Materials, 2011, v. 462-463, p. 710-715 | en_HK |
dc.identifier.issn | 1013-9826 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/126288 | - |
dc.description.abstract | By employing a dipole defect model, two-dimensional phase field simulations of domain switching in the crack tip vicinity of a crack embedded in a relaxor ferroelectric single crystal, which was subjected to mechanical loading and electric field, have been carried out. The interaction between the dipole defects and crack, the influence of the dipole defect concentration density on the switching process, and the coupling effect of mechanical stress and electric field on domain switching in the vicinity of the crack tip have been studied. Comparing the results obtained from relaxor ferroelectrics with those of normal ferroelectrics, the former showed that, due to the interaction between the dipole defects and crack, polarization switching in the vicinity of the crack tip was suppressed. Moreover, the coupling between applied mechanical stress and electric field can either promote or suppress domain switching in the vicinity of a crack. © (2011) Trans Tech Publications. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net | en_HK |
dc.relation.ispartof | Key Engineering Materials | en_HK |
dc.subject | Crack | en_HK |
dc.subject | Domain switching | en_HK |
dc.subject | Normal ferroelectric | en_HK |
dc.subject | Phase field simulation | en_HK |
dc.subject | Relaxor ferroelectric | en_HK |
dc.title | Phase field simulation of ferroelectrics with cracks | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1013-9826&volume=462-463&issue=1&spage=710&epage=715&date=2010&atitle=Phase+field+simulation+of+ferroelectrics+with+cracks | - |
dc.identifier.email | Soh, AK:aksoh@hkucc.hku.hk | en_HK |
dc.identifier.authority | Soh, AK=rp00170 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.4028/www.scientific.net/KEM.462-463.710 | en_HK |
dc.identifier.scopus | eid_2-s2.0-79551477112 | en_HK |
dc.identifier.hkuros | 172880 | en_HK |
dc.identifier.hkuros | 191567 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-79551477112&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 462-463 | en_HK |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 710 | en_HK |
dc.identifier.epage | 715 | en_HK |
dc.identifier.isi | WOS:000291450700122 | - |
dc.publisher.place | Switzerland | en_HK |
dc.description.other | The 8th International Conference on Fracture and Strength of Solids (FEOFS 2010), Kuala Lumpur, Malaysia, 7-9 June 2010. In Key Engineering Materials, 2011, v. 462-463, p. 710-715 | - |
dc.identifier.scopusauthorid | Zhao, XF=35202687000 | en_HK |
dc.identifier.scopusauthorid | Soh, AK=7006795203 | en_HK |
dc.identifier.issnl | 1013-9826 | - |