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Article: The Laue Data Module (LDM) - a software development for Laue X-ray diffraction data processing

TitleThe Laue Data Module (LDM) - a software development for Laue X-ray diffraction data processing
Authors
Campbell, JWClifton, IJHarding, MMHao, Q
Issue Date1995
PublisherBlackwell Munksgaard. The Journal's web site is located at http://www.blackwellpublishing.com/journals/JCR
Citation
Journal of Applied Crystallography, 1995, v. 28, p. 635-640 How to Cite?
DOI: http://dx.doi.org/10.1107/s0021889895005164
AbstractThe Laue Data Module (LDM) has been defined and implemented in Fortran as the basis for new developments in the processing of Laue X-ray diffraction data It provides a program-independent way of handling, storing and accessing the parameters required in the initial stages of Laue data processing. The program-independent Laue Reflection List (LRL) and associated functions have also been developed. The way in which these two developments may be used in application programs and as the basis for developing further program-independent Laue-data processing functions is described.
Persistent Identifierhttp://hdl.handle.net/10722/138605
ISSN
0021-8898
2020 Impact Factor: 3.304
2023 SCImago Journal Rankings: 1.561
ISI Accession Number ID
WOS:A1995TD66200031

 

DC FieldValueLanguage
dc.contributor.authorCampbell, JWen_US
dc.contributor.authorClifton, IJen_US
dc.contributor.authorHarding, MMen_US
dc.contributor.authorHao, Qen_US
dc.date.accessioned2011-09-02T06:49:10Z-
dc.date.available2011-09-02T06:49:10Z-
dc.date.issued1995en_US
dc.identifier.citationJournal of Applied Crystallography, 1995, v. 28, p. 635-640en_US
dc.identifier.issn0021-8898en_US
dc.identifier.urihttp://hdl.handle.net/10722/138605-
dc.description.abstractThe Laue Data Module (LDM) has been defined and implemented in Fortran as the basis for new developments in the processing of Laue X-ray diffraction data It provides a program-independent way of handling, storing and accessing the parameters required in the initial stages of Laue data processing. The program-independent Laue Reflection List (LRL) and associated functions have also been developed. The way in which these two developments may be used in application programs and as the basis for developing further program-independent Laue-data processing functions is described.en_US
dc.publisherBlackwell Munksgaard. The Journal's web site is located at http://www.blackwellpublishing.com/journals/JCRen_US
dc.relation.ispartofJournal of Applied Crystallographyen_US
dc.titleThe Laue Data Module (LDM) - a software development for Laue X-ray diffraction data processingen_US
dc.typeArticleen_US
dc.identifier.emailHao, Q: qhao@hku.hken_US
dc.identifier.authorityHao, Q=rp01332en_US
dc.identifier.doi10.1107/s0021889895005164en_US
dc.identifier.volume28en_US
dc.identifier.spage635en_US
dc.identifier.epage640en_US
dc.identifier.isiWOS:A1995TD66200031-
dc.identifier.issnl0021-8898-

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