Impacts of compressive strain on phase diagram of epitaxial Pr 0.5Sr0.5MnO3 films grown on LaAlO3 (0 0 1)

Abstract

Series Pr0.5Sr0.5MnO3 (PSMO) films of thickness ranging from 20 to 400 nm were epitaxially grown on (0 0 1)-oriented LaAlO3 using pulsed laser deposition method. The biaxial compressive strain effect on phase transition of the films was systematically investigated by both electrical and magnetic measurements. The 60 nm film shows a ferromagnetic metal to antiferromagnetic insulator (FMMAFI) transition at a temperature of ∼190 K. Such a FMMAFI transition is depressed as the films become thicker, and finally disappears in the strain-relaxed situation. On the other hand, the Curie temperature is remarkably enhanced (∼50 °C) when the film thickness increases from 60 to 400 nm. These results may yield the possibility to modulate the phase transitions by varying the structural strain. © 2011 Elsevier B.V. All rights reserved.