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Article: Free vibration and buckling analysis of plates by the negative stiffness method

TitleFree vibration and buckling analysis of plates by the negative stiffness method
Authors
Tham, LGChan, AHCCheung, YK
Issue Date1986
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/compstruc
Citation
Computers And Structures, 1986, v. 22 n. 4, p. 687-692 How to Cite?
AbstractThe problem of vibration and stability analysis of plates with abrupt change of thickness or with cutouts can be conveniently treated by the negative stiffness method, using the higher-order Mindlin plate element as the basic element. The method is simple and yet versatile, and its accuracy was fully tested against a number of numerical examples. © 1986.
Persistent Identifierhttp://hdl.handle.net/10722/149882
ISSN
0045-7949
2022 Impact Factor: 4.7
2020 SCImago Journal Rankings: 1.450
ISI Accession Number ID
WOS:A1986A265200022

 

DC FieldValueLanguage
dc.contributor.authorTham, LGen_US
dc.contributor.authorChan, AHCen_US
dc.contributor.authorCheung, YKen_US
dc.date.accessioned2012-06-26T06:00:20Z-
dc.date.available2012-06-26T06:00:20Z-
dc.date.issued1986en_US
dc.identifier.citationComputers And Structures, 1986, v. 22 n. 4, p. 687-692en_US
dc.identifier.issn0045-7949en_US
dc.identifier.urihttp://hdl.handle.net/10722/149882-
dc.description.abstractThe problem of vibration and stability analysis of plates with abrupt change of thickness or with cutouts can be conveniently treated by the negative stiffness method, using the higher-order Mindlin plate element as the basic element. The method is simple and yet versatile, and its accuracy was fully tested against a number of numerical examples. © 1986.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/compstrucen_US
dc.relation.ispartofComputers and Structuresen_US
dc.titleFree vibration and buckling analysis of plates by the negative stiffness methoden_US
dc.typeArticleen_US
dc.identifier.emailTham, LG:hrectlg@hkucc.hku.hken_US
dc.identifier.emailCheung, YK:hreccyk@hkucc.hku.hken_US
dc.identifier.authorityTham, LG=rp00176en_US
dc.identifier.authorityCheung, YK=rp00104en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0022529876en_US
dc.identifier.volume22en_US
dc.identifier.issue4en_US
dc.identifier.spage687en_US
dc.identifier.epage692en_US
dc.identifier.isiWOS:A1986A265200022-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridTham, LG=7006213628en_US
dc.identifier.scopusauthoridChan, AHC=37019603800en_US
dc.identifier.scopusauthoridCheung, YK=7202111065en_US
dc.identifier.issnl0045-7949-

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