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- Publisher Website: 10.1016/0022-0728(95)03853-9
- Scopus: eid_2-s2.0-0001714371
- WOS: WOS:A1995TE60700038
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Article: A model for the effective barrier height observed with a scanning tunneling microscope
Title | A model for the effective barrier height observed with a scanning tunneling microscope |
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Authors | |
Keywords | Electron Tunnelling Mathematical Model Scanning Tunnelling Microscopy |
Issue Date | 1995 |
Citation | Journal Of Electroanalytical Chemistry, 1995, v. 396 n. 1-2, p. 303-307 How to Cite? |
Abstract | We consider electron exchange between a metal tip and a metal electrode immersed in an aqueous solution. The tip and the substrate are modeled as jellium; the solution is treated on the Gouy-Chapman level. We construct an effective energy barrier for the tunneling electron by a superposition of its interaction with the two metals and an approximate solution of the nonlinear Poisson-Boltzmann equation. The rate of electron tunneling is calculated by solving the appropriate Schrödinger equation; the effective barrier height is then obtained by calculating the change of the tunneling current with distance. © 1995. |
Persistent Identifier | http://hdl.handle.net/10722/167361 |
ISSN | |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Pecina, O | en_US |
dc.contributor.author | Schmickler, W | en_US |
dc.contributor.author | Chan, KY | en_US |
dc.contributor.author | Henderson, DJ | en_US |
dc.date.accessioned | 2012-10-08T03:06:03Z | - |
dc.date.available | 2012-10-08T03:06:03Z | - |
dc.date.issued | 1995 | en_US |
dc.identifier.citation | Journal Of Electroanalytical Chemistry, 1995, v. 396 n. 1-2, p. 303-307 | en_US |
dc.identifier.issn | 0022-0728 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/167361 | - |
dc.description.abstract | We consider electron exchange between a metal tip and a metal electrode immersed in an aqueous solution. The tip and the substrate are modeled as jellium; the solution is treated on the Gouy-Chapman level. We construct an effective energy barrier for the tunneling electron by a superposition of its interaction with the two metals and an approximate solution of the nonlinear Poisson-Boltzmann equation. The rate of electron tunneling is calculated by solving the appropriate Schrödinger equation; the effective barrier height is then obtained by calculating the change of the tunneling current with distance. © 1995. | en_US |
dc.language | eng | en_US |
dc.relation.ispartof | Journal of Electroanalytical Chemistry | en_US |
dc.subject | Electron Tunnelling | en_US |
dc.subject | Mathematical Model | en_US |
dc.subject | Scanning Tunnelling Microscopy | en_US |
dc.title | A model for the effective barrier height observed with a scanning tunneling microscope | en_US |
dc.type | Article | en_US |
dc.identifier.email | Chan, KY:hrsccky@hku.hk | en_US |
dc.identifier.authority | Chan, KY=rp00662 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1016/0022-0728(95)03853-9 | - |
dc.identifier.scopus | eid_2-s2.0-0001714371 | en_US |
dc.identifier.hkuros | 9412 | - |
dc.identifier.volume | 396 | en_US |
dc.identifier.issue | 1-2 | en_US |
dc.identifier.spage | 303 | en_US |
dc.identifier.epage | 307 | en_US |
dc.identifier.isi | WOS:A1995TE60700038 | - |
dc.identifier.scopusauthorid | Pecina, O=6601995219 | en_US |
dc.identifier.scopusauthorid | Schmickler, W=7004958833 | en_US |
dc.identifier.scopusauthorid | Chan, KY=7406034142 | en_US |
dc.identifier.scopusauthorid | Henderson, DJ=7402988756 | en_US |
dc.identifier.issnl | 0022-0728 | - |