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Article: CHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.

TitleCHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.
Authors
Fung, SNicholas, RJDavison, AMStradling, RA
KeywordsDoping
Photoconductivity
Semiconductors (III-V)
Issue Date1981
PublisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Citation
Electronics Letters, 1981, v. 17 n. 5, p. 188-189 How to Cite?
AbstractA photoconductivity study has been made of nominally undoped VPE n-InP materials grown on semi-insulating InP:Fe substrates. The photoresponse spectra obtained indicate features characteristic of Cr deep acceptors. By comparing the magnitudes of the photoresponse with that of a back-doped InP:Cr reference sample, the concentration has been estimated at between 2 and 8 multiplied by 10**1**4 cm** minus **3.
Persistent Identifierhttp://hdl.handle.net/10722/174675
ISSN
0013-5194
2023 Impact Factor: 0.7
2023 SCImago Journal Rankings: 0.323
ISI Accession Number ID
WOS:A1981LV20900009

 

DC FieldValueLanguage
dc.contributor.authorFung, Sen_US
dc.contributor.authorNicholas, RJen_US
dc.contributor.authorDavison, AMen_US
dc.contributor.authorStradling, RAen_US
dc.date.accessioned2012-11-26T08:46:50Z-
dc.date.available2012-11-26T08:46:50Z-
dc.date.issued1981en_US
dc.identifier.citationElectronics Letters, 1981, v. 17 n. 5, p. 188-189en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://hdl.handle.net/10722/174675-
dc.description.abstractA photoconductivity study has been made of nominally undoped VPE n-InP materials grown on semi-insulating InP:Fe substrates. The photoresponse spectra obtained indicate features characteristic of Cr deep acceptors. By comparing the magnitudes of the photoresponse with that of a back-doped InP:Cr reference sample, the concentration has been estimated at between 2 and 8 multiplied by 10**1**4 cm** minus **3.en_US
dc.languageengen_US
dc.publisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/ELen_US
dc.relation.ispartofElectronics Lettersen_US
dc.subjectDoping-
dc.subjectPhotoconductivity-
dc.subjectSemiconductors (III-V)-
dc.titleCHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.en_US
dc.typeArticleen_US
dc.identifier.emailFung, S: sfung@hku.hken_US
dc.identifier.authorityFung, S=rp00695en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0019873165en_US
dc.identifier.volume17en_US
dc.identifier.issue5en_US
dc.identifier.spage188en_US
dc.identifier.epage189en_US
dc.identifier.isiWOS:A1981LV20900009-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridFung, S=7201970040en_US
dc.identifier.scopusauthoridNicholas, RJ=7102569757en_US
dc.identifier.scopusauthoridDavison, AM=7201753776en_US
dc.identifier.scopusauthoridStradling, RA=7005186901en_US
dc.identifier.issnl0013-5194-

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