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Article: Study of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holography
Title | Study of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holography |
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Authors | |
Keywords | Photoelectron Holography Surface Structure |
Issue Date | 2003 |
Publisher | World Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/srl/srl.shtml |
Citation | Surface Review And Letters, 2003, v. 10 n. 6, p. 925-932 How to Cite? |
Abstract | The k derivative spectra (KDS) transform is used for construction of the three-dimensional atomic structure of the C 2H 4/Si(100)-(2 × 1) system from photoelectron diffraction data. The image function obtained by the KDS transform clearly observes the second-layer Si atoms and the C emitters apart from the first-layer Si atoms. The observations of the second-layer Si atoms and the C emitters make it easy to measure the C-C bond length correctly. Then a conclusive adsorption model - the di-σ model - for the C 2H 4/Si(100)-(2 × 1) system is established. In comparison with the KDS transform, the normal small-cone transform hardly measures the C-C bond length. The ability to observe more scatterers of a photoelectron emitter by the KDS transform expands the applicability of holographic imaging. |
Persistent Identifier | http://hdl.handle.net/10722/174929 |
ISSN | 2023 Impact Factor: 1.2 2023 SCImago Journal Rankings: 0.226 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Xu, SH | en_US |
dc.contributor.author | Wu, HS | en_US |
dc.contributor.author | Tong, SY | en_US |
dc.contributor.author | Keeffe, M | en_US |
dc.contributor.author | Lapeyre, GJ | en_US |
dc.contributor.author | Rotenberg, E | en_US |
dc.date.accessioned | 2012-11-26T08:48:12Z | - |
dc.date.available | 2012-11-26T08:48:12Z | - |
dc.date.issued | 2003 | en_US |
dc.identifier.citation | Surface Review And Letters, 2003, v. 10 n. 6, p. 925-932 | en_US |
dc.identifier.issn | 0218-625X | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/174929 | - |
dc.description.abstract | The k derivative spectra (KDS) transform is used for construction of the three-dimensional atomic structure of the C 2H 4/Si(100)-(2 × 1) system from photoelectron diffraction data. The image function obtained by the KDS transform clearly observes the second-layer Si atoms and the C emitters apart from the first-layer Si atoms. The observations of the second-layer Si atoms and the C emitters make it easy to measure the C-C bond length correctly. Then a conclusive adsorption model - the di-σ model - for the C 2H 4/Si(100)-(2 × 1) system is established. In comparison with the KDS transform, the normal small-cone transform hardly measures the C-C bond length. The ability to observe more scatterers of a photoelectron emitter by the KDS transform expands the applicability of holographic imaging. | en_US |
dc.language | eng | en_US |
dc.publisher | World Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/srl/srl.shtml | en_US |
dc.relation.ispartof | Surface Review and Letters | en_US |
dc.subject | Photoelectron Holography | en_US |
dc.subject | Surface Structure | en_US |
dc.title | Study of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holography | en_US |
dc.type | Article | en_US |
dc.identifier.email | Wu, HS: hswu@hkucc.hku.hk | en_US |
dc.identifier.authority | Wu, HS=rp00813 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1142/S0218625X03005670 | en_US |
dc.identifier.scopus | eid_2-s2.0-1542410408 | en_US |
dc.identifier.hkuros | 88428 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-1542410408&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 10 | en_US |
dc.identifier.issue | 6 | en_US |
dc.identifier.spage | 925 | en_US |
dc.identifier.epage | 932 | en_US |
dc.identifier.isi | WOS:000220312100013 | - |
dc.publisher.place | Singapore | en_US |
dc.identifier.scopusauthorid | Xu, SH=36832008600 | en_US |
dc.identifier.scopusauthorid | Wu, HS=7405584367 | en_US |
dc.identifier.scopusauthorid | Tong, SY=24512624800 | en_US |
dc.identifier.scopusauthorid | Keeffe, M=6507187080 | en_US |
dc.identifier.scopusauthorid | Lapeyre, GJ=35515323300 | en_US |
dc.identifier.scopusauthorid | Rotenberg, E=7006230675 | en_US |
dc.identifier.issnl | 0218-625X | - |