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Conference Paper: Study of semi-insulating LEC InP in China
Title | Study of semi-insulating LEC InP in China |
---|---|
Authors | |
Issue Date | 2002 |
Citation | Conference Proceedings - International Conference On Indium Phosphide And Related Materials, 2002, p. 509-512 How to Cite? |
Abstract | The thermally induced defects in semi-insulating (SI) liquid encapsulated Czochralski (LEC) InP was studied. The undoped n-type high purity LEC-InP became semi-insualting when it was annealed between 800 °C and 900 °C in vacuum. The results showed that the different annealing durations caused different defect in the materials. |
Persistent Identifier | http://hdl.handle.net/10722/176164 |
ISSN | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sun, N | en_HK |
dc.contributor.author | Wu, X | en_HK |
dc.contributor.author | Zhao, Y | en_HK |
dc.contributor.author | Shen, N | en_HK |
dc.contributor.author | Chen, X | en_HK |
dc.contributor.author | Pu, C | en_HK |
dc.contributor.author | Bi, K | en_HK |
dc.contributor.author | Yang, G | en_HK |
dc.contributor.author | Xu, Y | en_HK |
dc.contributor.author | Yang, K | en_HK |
dc.contributor.author | Zhao, Z | en_HK |
dc.contributor.author | Sun, T | en_HK |
dc.contributor.author | Guo, W | en_HK |
dc.contributor.author | Lin, L | en_HK |
dc.contributor.author | Wang, L | en_HK |
dc.contributor.author | Zhao, Q | en_HK |
dc.contributor.author | Huang, Y | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.date.accessioned | 2012-11-26T09:06:33Z | - |
dc.date.available | 2012-11-26T09:06:33Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Conference Proceedings - International Conference On Indium Phosphide And Related Materials, 2002, p. 509-512 | en_US |
dc.identifier.issn | 1092-8669 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/176164 | - |
dc.description.abstract | The thermally induced defects in semi-insulating (SI) liquid encapsulated Czochralski (LEC) InP was studied. The undoped n-type high purity LEC-InP became semi-insualting when it was annealed between 800 °C and 900 °C in vacuum. The results showed that the different annealing durations caused different defect in the materials. | en_HK |
dc.language | eng | en_US |
dc.relation.ispartof | Conference Proceedings - International Conference on Indium Phosphide and Related Materials | en_HK |
dc.title | Study of semi-insulating LEC InP in China | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.scopus | eid_2-s2.0-0036055848 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036055848&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.spage | 509 | en_HK |
dc.identifier.epage | 512 | en_HK |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Sun, N=7202556986 | en_HK |
dc.identifier.scopusauthorid | Wu, X=7407063392 | en_HK |
dc.identifier.scopusauthorid | Zhao, Y=7406633326 | en_HK |
dc.identifier.scopusauthorid | Shen, N=7102785740 | en_HK |
dc.identifier.scopusauthorid | Chen, X=26642908200 | en_HK |
dc.identifier.scopusauthorid | Pu, C=55419723900 | en_HK |
dc.identifier.scopusauthorid | Bi, K=7004436355 | en_HK |
dc.identifier.scopusauthorid | Yang, G=8693019600 | en_HK |
dc.identifier.scopusauthorid | Xu, Y=37035703100 | en_HK |
dc.identifier.scopusauthorid | Yang, K=14326327100 | en_HK |
dc.identifier.scopusauthorid | Zhao, Z=7404148480 | en_HK |
dc.identifier.scopusauthorid | Sun, T=7402922751 | en_HK |
dc.identifier.scopusauthorid | Guo, W=7401967706 | en_HK |
dc.identifier.scopusauthorid | Lin, L=7404131111 | en_HK |
dc.identifier.scopusauthorid | Wang, L=7409177288 | en_HK |
dc.identifier.scopusauthorid | Zhao, Q=55479203400 | en_HK |
dc.identifier.scopusauthorid | Huang, Y=23977949200 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.issnl | 1092-8669 | - |