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- Publisher Website: 10.1016/j.jallcom.2013.03.039
- Scopus: eid_2-s2.0-84875915993
- WOS: WOS:000317817200034
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Article: Bias-voltage dependent ultraviolet photodetectors prepared by GaOx + ZnO mixture phase nanocrystalline thin films
Title | Bias-voltage dependent ultraviolet photodetectors prepared by GaOx + ZnO mixture phase nanocrystalline thin films |
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Authors | |
Keywords | Optical materials Oxide material Semiconductor Thin film |
Issue Date | 2013 |
Publisher | Elsevier B.V.. The Journal's web site is located at http://www.elsevier.com/locate/jallcom |
Citation | Journal of Alloys and Compounds, 2013, v. 566, p. 201-205 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/186165 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wang, RX | en_US |
dc.contributor.author | Yang, LC | en_US |
dc.contributor.author | Xu, S | en_US |
dc.contributor.author | Zhang, XD | en_US |
dc.contributor.author | Dong, X | en_US |
dc.contributor.author | Zhao, YC | en_US |
dc.contributor.author | Fu, K | en_US |
dc.contributor.author | Zhang, BS | en_US |
dc.contributor.author | Yang, H | en_US |
dc.date.accessioned | 2013-08-20T11:57:25Z | - |
dc.date.available | 2013-08-20T11:57:25Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.citation | Journal of Alloys and Compounds, 2013, v. 566, p. 201-205 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/186165 | - |
dc.language | eng | en_US |
dc.publisher | Elsevier B.V.. The Journal's web site is located at http://www.elsevier.com/locate/jallcom | en_US |
dc.relation.ispartof | Journal of Alloys and Compounds | en_US |
dc.subject | Optical materials | - |
dc.subject | Oxide material | - |
dc.subject | Semiconductor | - |
dc.subject | Thin film | - |
dc.title | Bias-voltage dependent ultraviolet photodetectors prepared by GaOx + ZnO mixture phase nanocrystalline thin films | en_US |
dc.type | Article | en_US |
dc.identifier.email | Xu, S: sjxu@hku.hk | en_US |
dc.identifier.authority | Xu, S=rp00821 | en_US |
dc.identifier.doi | 10.1016/j.jallcom.2013.03.039 | - |
dc.identifier.scopus | eid_2-s2.0-84875915993 | - |
dc.identifier.hkuros | 218993 | en_US |
dc.identifier.volume | 566 | en_US |
dc.identifier.spage | 201 | en_US |
dc.identifier.epage | 205 | en_US |
dc.identifier.isi | WOS:000317817200034 | - |
dc.publisher.place | Amsterdam | en_US |