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Article: Bayesian Analysis of 3-State Devices

TitleBayesian Analysis of 3-State Devices
Authors
Bacon-Shone, J
Issue Date1982
PublisherIEEE.
Citation
IEEE Transactions on Reliability, 1982, v. 31 n. 1, p. 123 How to Cite?
DOI: http://dx.doi.org/10.1109/TR.1982.5221260
Persistent Identifierhttp://hdl.handle.net/10722/188763
ISSN
0018-9529
2023 Impact Factor: 5.0
2023 SCImago Journal Rankings: 1.511

 

DC FieldValueLanguage
dc.contributor.authorBacon-Shone, J-
dc.date.accessioned2013-09-11T08:06:16Z-
dc.date.available2013-09-11T08:06:16Z-
dc.date.issued1982-
dc.identifier.citationIEEE Transactions on Reliability, 1982, v. 31 n. 1, p. 123-
dc.identifier.issn0018-9529-
dc.identifier.urihttp://hdl.handle.net/10722/188763-
dc.languageeng-
dc.publisherIEEE.-
dc.relation.ispartofIEEE Transactions on Reliability-
dc.rights©1982 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.titleBayesian Analysis of 3-State Devicesen_US
dc.typeArticleen_US
dc.identifier.emailBacon-Shone, JH: johnbs@hku.hk-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/TR.1982.5221260-
dc.identifier.volume31-
dc.identifier.issue1-
dc.identifier.spage123-
dc.identifier.epage123-
dc.publisher.placeNew York-
dc.identifier.issnl0018-9529-

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