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Conference Paper: Characterizing the secondary phase in Co-implanted ZnO : a comprehensive approach using vibrating sample magnetometer, x-ray diffraction, x-ray photoelectron spectroscopy, photoluminescence and impedance spectroscopy

TitleCharacterizing the secondary phase in Co-implanted ZnO : a comprehensive approach using vibrating sample magnetometer, x-ray diffraction, x-ray photoelectron spectroscopy, photoluminescence and impedance spectroscopy
Authors
Issue Date2013
Citation
The 6th National ZnO Conference (ZnO 2013), Xiamen, China, 5-7 December 2013 How to Cite?
第六屆全國氧化鋅學術會議 (ZnO 2013), 中國廈門, 2013年12月5日至7日 How to Cite?
Description分會專題: ZnO 基磁性材料及自旋電子學器件
Persistent Identifierhttp://hdl.handle.net/10722/199470

 

DC FieldValueLanguage
dc.contributor.authorYounas, Men_US
dc.contributor.authorLing, FCCen_US
dc.contributor.authorNadeem, Men_US
dc.contributor.authorAnwand, Wen_US
dc.contributor.authorWagner, Aen_US
dc.contributor.authorHao, JHen_US
dc.contributor.authorLeung, CWen_US
dc.date.accessioned2014-07-22T01:19:53Z-
dc.date.available2014-07-22T01:19:53Z-
dc.date.issued2013en_US
dc.identifier.citationThe 6th National ZnO Conference (ZnO 2013), Xiamen, China, 5-7 December 2013en_US
dc.identifier.citation第六屆全國氧化鋅學術會議 (ZnO 2013), 中國廈門, 2013年12月5日至7日-
dc.identifier.urihttp://hdl.handle.net/10722/199470-
dc.description分會專題: ZnO 基磁性材料及自旋電子學器件-
dc.languageengen_US
dc.relation.ispartofNational ZnO Conference (ZnO 2013en_US
dc.titleCharacterizing the secondary phase in Co-implanted ZnO : a comprehensive approach using vibrating sample magnetometer, x-ray diffraction, x-ray photoelectron spectroscopy, photoluminescence and impedance spectroscopyen_US
dc.typeConference_Paperen_US
dc.identifier.emailLing, FCC: ccling@hkucc.hku.hken_US
dc.identifier.authorityLing, FCC=rp00747en_US
dc.identifier.hkuros230876en_US

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