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Article: Current induced abnormal electroresistance effect observed in epitaxial La0.9Hf0.1MnO3 thin films

TitleCurrent induced abnormal electroresistance effect observed in epitaxial La0.9Hf0.1MnO3 thin films
Authors
Issue Date2014
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2014, v. 115 n. 20, article no. 203706, p. 1-5 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/200798
ISSN
2021 Impact Factor: 2.877
2020 SCImago Journal Rankings: 0.699
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorXing, Jen_US
dc.contributor.authorGao, Jen_US
dc.contributor.authorWang, Len_US
dc.date.accessioned2014-08-21T07:01:44Z-
dc.date.available2014-08-21T07:01:44Z-
dc.date.issued2014en_US
dc.identifier.citationJournal of Applied Physics, 2014, v. 115 n. 20, article no. 203706, p. 1-5-
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10722/200798-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsCopyright 2014 AIP Publishing LLC. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Applied Physics, 2014, v. 115 n. 20, article no. 203706, p. 1-5 and may be found at https://doi.org/10.1063/1.4879318-
dc.titleCurrent induced abnormal electroresistance effect observed in epitaxial La0.9Hf0.1MnO3 thin filmsen_US
dc.typeArticleen_US
dc.identifier.emailXing, J: xingjie@hku.hken_US
dc.identifier.emailGao, J: jugao@hku.hken_US
dc.identifier.authorityGao, J=rp00699en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4879318en_US
dc.identifier.scopuseid_2-s2.0-84901987219-
dc.identifier.hkuros233768en_US
dc.identifier.volume115en_US
dc.identifier.issue20-
dc.identifier.spagearticle no. 203706, p. 1-
dc.identifier.epagearticle no. 203706, p. 5-
dc.identifier.isiWOS:000337143500039-
dc.publisher.placeUnited Statesen_US
dc.identifier.issnl0021-8979-

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