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Article: Response to “Comment on ‘Change of the emission spectra in organic light-emitting diodes by layer thickness modification’”

TitleResponse to “Comment on ‘Change of the emission spectra in organic light-emitting diodes by layer thickness modification’”
Authors
Cheung, CHDjurisic, ABKwong, CYTam, HLCheah, KWLiu, ZTChan, WKChui, PCChan, JRakic, AD
Issue Date2005
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2005, v. 86 n. 18, article no. 186102 How to Cite?
DOI: http://dx.doi.org/10.1063/1.1925322
Persistent Identifierhttp://hdl.handle.net/10722/209296
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000229288700063

 

DC FieldValueLanguage
dc.contributor.authorCheung, CHen_US
dc.contributor.authorDjurisic, ABen_US
dc.contributor.authorKwong, CYen_US
dc.contributor.authorTam, HLen_US
dc.contributor.authorCheah, KWen_US
dc.contributor.authorLiu, ZTen_US
dc.contributor.authorChan, WKen_US
dc.contributor.authorChui, PCen_US
dc.contributor.authorChan, Jen_US
dc.contributor.authorRakic, ADen_US
dc.date.accessioned2015-04-17T05:04:13Z-
dc.date.available2015-04-17T05:04:13Z-
dc.date.issued2005en_US
dc.identifier.citationApplied Physics Letters, 2005, v. 86 n. 18, article no. 186102-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10722/209296-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.rightsCopyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2005, v. 86 n. 18, article no. 186102 and may be found at https://doi.org/10.1063/1.1925322-
dc.titleResponse to “Comment on ‘Change of the emission spectra in organic light-emitting diodes by layer thickness modification’”en_US
dc.typeArticleen_US
dc.identifier.emailDjurisic, AB: dalek@hku.hken_US
dc.identifier.emailChan, WK: waichan@hku.hken_US
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_US
dc.identifier.authorityDjurisic, AB=rp00690en_US
dc.identifier.authorityChan, WK=rp00667en_US
dc.identifier.authorityChui, PC=rp00114en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.1925322en_US
dc.identifier.hkuros242867en_US
dc.identifier.volume86en_US
dc.identifier.issue18en_US
dc.identifier.spagearticle no. 186102en_US
dc.identifier.epagearticle no. 186102en_US
dc.identifier.isiWOS:000229288700063-
dc.publisher.placeUnited Statesen_US
dc.identifier.issnl0003-6951-

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