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- Publisher Website: 10.1109/ROBOT.2005.1570114
- Scopus: eid_2-s2.0-33846149041
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Conference Paper: Planning and control for automated nanorobotic assembly
Title | Planning and control for automated nanorobotic assembly |
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Authors | |
Keywords | Nanomanipulation Atomic Force Microscopy Nanomanufacturing CAD Drift compensation Nanoassembly |
Issue Date | 2005 |
Citation | Proceedings - IEEE International Conference on Robotics and Automation, 2005, v. 2005, p. 169-174 How to Cite? |
Abstract | Nanomanufacturing using Atomic Force Microcopy has been widely investigated. Most of nanomanipulation schemes go through the scan-design-manipulation-scan cycle manually which is time consuming and inefficient. Automated AFM tip path planning is desirable for nanomanufacturing, but does not receive much attention. In this paper, a CAD guided automated nanomanufacturing system is presented. Based on the CAD model of a nanostructure, the manipulation paths for both nanoparticles and nanorods are generated automatically. A local scanning method is developed to compensate for the random drift that may cause the failure of the nano-assembly. The experimental results demonstrate that the developed algorithm can be employed to manufacture nanostructures efficiently. The research work opens a door to the CAD guided automated nanomanufacturing. © 2005 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/212896 |
ISSN | 2023 SCImago Journal Rankings: 1.620 |
DC Field | Value | Language |
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dc.contributor.author | Chen, Heping | - |
dc.contributor.author | Xi, Ning | - |
dc.contributor.author | Li, Guangyong | - |
dc.contributor.author | Zhang, Jiangbo | - |
dc.contributor.author | Prokos, Mathew | - |
dc.date.accessioned | 2015-07-28T04:05:21Z | - |
dc.date.available | 2015-07-28T04:05:21Z | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | Proceedings - IEEE International Conference on Robotics and Automation, 2005, v. 2005, p. 169-174 | - |
dc.identifier.issn | 1050-4729 | - |
dc.identifier.uri | http://hdl.handle.net/10722/212896 | - |
dc.description.abstract | Nanomanufacturing using Atomic Force Microcopy has been widely investigated. Most of nanomanipulation schemes go through the scan-design-manipulation-scan cycle manually which is time consuming and inefficient. Automated AFM tip path planning is desirable for nanomanufacturing, but does not receive much attention. In this paper, a CAD guided automated nanomanufacturing system is presented. Based on the CAD model of a nanostructure, the manipulation paths for both nanoparticles and nanorods are generated automatically. A local scanning method is developed to compensate for the random drift that may cause the failure of the nano-assembly. The experimental results demonstrate that the developed algorithm can be employed to manufacture nanostructures efficiently. The research work opens a door to the CAD guided automated nanomanufacturing. © 2005 IEEE. | - |
dc.language | eng | - |
dc.relation.ispartof | Proceedings - IEEE International Conference on Robotics and Automation | - |
dc.subject | Nanomanipulation | - |
dc.subject | Atomic Force Microscopy | - |
dc.subject | Nanomanufacturing | - |
dc.subject | CAD | - |
dc.subject | Drift compensation | - |
dc.subject | Nanoassembly | - |
dc.title | Planning and control for automated nanorobotic assembly | - |
dc.type | Conference_Paper | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/ROBOT.2005.1570114 | - |
dc.identifier.scopus | eid_2-s2.0-33846149041 | - |
dc.identifier.volume | 2005 | - |
dc.identifier.spage | 169 | - |
dc.identifier.epage | 174 | - |
dc.identifier.issnl | 1050-4729 | - |