AFM image reconstruction based on accurate tip model

Abstract

Atom force microscopy has been generally applied in obtaining nano-scale images. The shape and size of the tip are the key factors affecting the precision of the scanning image. In order to get high precision image, the tip shape is required to be estimated and used to reconstruct the scanning image. Recently several algorithms have been put forward, and the blind tip estimation algorithm among them is widely used. This algorithm has difficulties in estimating the optimal noise threshold to reduce the noise effects in the specimen image. A new method for determining the optimal noise threshold in the algorithm is proposed. The estimated tip is used to scan the TGZ01 and then reconstruct the scanning image. Experimental result demonstrates that the tip broad effect is decreased in the reconstructed image, which improves the scanning precision.