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- Publisher Website: 10.1109/MNANO.2013.2237711
- Scopus: eid_2-s2.0-84875725441
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Article: Video rate atomic force microscopy: Use of compressive scanning for nanoscale video imaging
Title | Video rate atomic force microscopy: Use of compressive scanning for nanoscale video imaging |
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Authors | |
Issue Date | 2013 |
Citation | IEEE Nanotechnology Magazine, 2013, v. 7, n. 1, p. 4-8 How to Cite? |
Abstract | Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds. © 2013 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/213300 |
ISSN | 2023 Impact Factor: 2.3 2023 SCImago Journal Rankings: 0.409 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Xi, Ning | - |
dc.contributor.author | Song, Bo | - |
dc.contributor.author | Yang, Ruiguo | - |
dc.contributor.author | Lai, King | - |
dc.contributor.author | Chen, Hongzhi | - |
dc.contributor.author | Qu, Chengeng | - |
dc.contributor.author | Chen, Liangliang | - |
dc.date.accessioned | 2015-07-28T04:06:49Z | - |
dc.date.available | 2015-07-28T04:06:49Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | IEEE Nanotechnology Magazine, 2013, v. 7, n. 1, p. 4-8 | - |
dc.identifier.issn | 1932-4510 | - |
dc.identifier.uri | http://hdl.handle.net/10722/213300 | - |
dc.description.abstract | Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds. © 2013 IEEE. | - |
dc.language | eng | - |
dc.relation.ispartof | IEEE Nanotechnology Magazine | - |
dc.title | Video rate atomic force microscopy: Use of compressive scanning for nanoscale video imaging | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/MNANO.2013.2237711 | - |
dc.identifier.scopus | eid_2-s2.0-84875725441 | - |
dc.identifier.volume | 7 | - |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 4 | - |
dc.identifier.epage | 8 | - |
dc.identifier.isi | WOS:000219743800002 | - |
dc.identifier.issnl | 1932-4510 | - |