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Article: Investigation of the behaviour of electronic resistive switching memory based on MoSe2-doped ultralong Se microwires
Title | Investigation of the behaviour of electronic resistive switching memory based on MoSe2-doped ultralong Se microwires |
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Authors | |
Issue Date | 2016 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 2016, v. 109 n. 14, article no. 143904, p. 1-5 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/242496 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Zhou, GD | - |
dc.contributor.author | Sun, B | - |
dc.contributor.author | Yao, YQ | - |
dc.contributor.author | hang, HH | - |
dc.contributor.author | Zhou, AK | - |
dc.contributor.author | Alameh, K | - |
dc.contributor.author | Ding, BF | - |
dc.contributor.author | Song, QL | - |
dc.date.accessioned | 2017-07-24T01:40:32Z | - |
dc.date.available | 2017-07-24T01:40:32Z | - |
dc.date.issued | 2016 | - |
dc.identifier.citation | Applied Physics Letters, 2016, v. 109 n. 14, article no. 143904, p. 1-5 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10722/242496 | - |
dc.language | eng | - |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.rights | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 2016, v. 109 n. 14, article no. 143904, p. 1-5 and may be found at https://doi.org/10.1063/1.4962655 | - |
dc.title | Investigation of the behaviour of electronic resistive switching memory based on MoSe2-doped ultralong Se microwires | - |
dc.type | Article | - |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1063/1.4962655 | - |
dc.identifier.scopus | eid_2-s2.0-84990818426 | - |
dc.identifier.hkuros | 273273 | - |
dc.identifier.volume | 109 | - |
dc.identifier.issue | 14 | - |
dc.identifier.spage | article no. 143904, p. 1 | - |
dc.identifier.epage | article no. 143904, p. 5 | - |
dc.identifier.isi | WOS:000386152800074 | - |
dc.publisher.place | United States | - |
dc.identifier.issnl | 0003-6951 | - |