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Conference Paper: A novel nonlinear process monitoring approach: Locally weighted learning based total PLS

TitleA novel nonlinear process monitoring approach: Locally weighted learning based total PLS
Authors
Xie, XLam, JShen, YCheung, KC
Issue Date2016
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000352
Citation
Proceedings of the 42nd Annual Conference of the IEEE Industrial Electronics Society (IECON 2016), Florence, Italy, 23-26 October 2016, p. 7137-7142 How to Cite?
DOI: http://dx.doi.org/10.1109/IECON.2016.7793626
Persistent Identifierhttp://hdl.handle.net/10722/245545

 

DC FieldValueLanguage
dc.contributor.authorXie, X-
dc.contributor.authorLam, J-
dc.contributor.authorShen, Y-
dc.contributor.authorCheung, KC-
dc.date.accessioned2017-09-18T02:12:34Z-
dc.date.available2017-09-18T02:12:34Z-
dc.date.issued2016-
dc.identifier.citationProceedings of the 42nd Annual Conference of the IEEE Industrial Electronics Society (IECON 2016), Florence, Italy, 23-26 October 2016, p. 7137-7142-
dc.identifier.urihttp://hdl.handle.net/10722/245545-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000352-
dc.relation.ispartofAnnual Conference of Industrial Electronics Society Proceedings-
dc.rightsAnnual Conference of Industrial Electronics Society Proceedings. Copyright © IEEE.-
dc.rights©2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleA novel nonlinear process monitoring approach: Locally weighted learning based total PLS-
dc.typeConference_Paper-
dc.identifier.emailLam, J: jlam@hku.hk-
dc.identifier.emailCheung, KC: kccheung@hku.hk-
dc.identifier.authorityLam, J=rp00133-
dc.identifier.authorityCheung, KC=rp01322-
dc.identifier.doi10.1109/IECON.2016.7793626-
dc.identifier.scopuseid_2-s2.0-85010030992-
dc.identifier.hkuros277834-
dc.identifier.spage7137-
dc.identifier.epage7142-
dc.publisher.placeUnited States-

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