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Article: On determining dead layer and detector thicknesses for a position-sensitive silicon detector

TitleOn determining dead layer and detector thicknesses for a position-sensitive silicon detector
Authors
Manfredi, JLee, HCJLynch, WGNiu, CYTsang, MBAnderson, CBarney, JBrown, KWChajecki, ZChan, KPChen, GEstee, JLi, ZPruitt, CRogers, AMSanetullaev, ASetiawan, HShowalter, RTsang, CYWinkelbauer, JRXiao, ZXu, Z
KeywordsAlpha source calibration
Dead layer
Pin source
Si-CsI calibration
Silicon detectors
Issue Date2018
PublisherElsevier Science B.V.
Citation
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2018, v. 888, p. 177-183 How to Cite?
DOI: http://dx.doi.org/10.1016/j.nima.2017.12.082
Persistent Identifierhttp://hdl.handle.net/10722/251796
ISI Accession Number ID
WOS:000425974100024

 

DC FieldValueLanguage
dc.contributor.authorManfredi, J-
dc.contributor.authorLee, HCJ-
dc.contributor.authorLynch, WG-
dc.contributor.authorNiu, CY-
dc.contributor.authorTsang, MB-
dc.contributor.authorAnderson, C-
dc.contributor.authorBarney, J-
dc.contributor.authorBrown, KW-
dc.contributor.authorChajecki, Z-
dc.contributor.authorChan, KP-
dc.contributor.authorChen, G-
dc.contributor.authorEstee, J-
dc.contributor.authorLi, Z-
dc.contributor.authorPruitt, C-
dc.contributor.authorRogers, AM-
dc.contributor.authorSanetullaev, A-
dc.contributor.authorSetiawan, H-
dc.contributor.authorShowalter, R-
dc.contributor.authorTsang, CY-
dc.contributor.authorWinkelbauer, JR-
dc.contributor.authorXiao, Z-
dc.contributor.authorXu, Z-
dc.date.accessioned2018-03-19T07:01:23Z-
dc.date.available2018-03-19T07:01:23Z-
dc.date.issued2018-
dc.identifier.citationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2018, v. 888, p. 177-183-
dc.identifier.urihttp://hdl.handle.net/10722/251796-
dc.languageeng-
dc.publisherElsevier Science B.V.-
dc.relation.ispartofNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.subjectAlpha source calibration-
dc.subjectDead layer-
dc.subjectPin source-
dc.subjectSi-CsI calibration-
dc.subjectSilicon detectors-
dc.titleOn determining dead layer and detector thicknesses for a position-sensitive silicon detector-
dc.typeArticle-
dc.identifier.emailLee, HCJ: jleehc@hku.hk-
dc.identifier.authorityLee, HCJ=rp01902-
dc.description.naturepostprint-
dc.identifier.doi10.1016/j.nima.2017.12.082-
dc.identifier.scopuseid_2-s2.0-85041489294-
dc.identifier.hkuros284545-
dc.identifier.volume888-
dc.identifier.spage177-
dc.identifier.epage183-
dc.identifier.isiWOS:000425974100024-

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