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Article: Dirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit

TitleDirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit
Authors
Liu, FQiu, CGZhang, ZYPeng, LMWang, JGuo, H
KeywordsGraphene
low power
MOSFET
steep switching
subthreshold swing (SS)
transition metal dichalcogenides (TMDC)
Issue Date2018
PublisherIEEE (Institute of Electrical and Electronics Engineers). The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16
Citation
IEEE Transactions on Electron Devices, 2018, v. 65 n. 7, p. 2736-2743 How to Cite?
DOI: http://dx.doi.org/10.1109/TED.2018.2836387
Persistent Identifierhttp://hdl.handle.net/10722/256379
ISSN
0018-9383
2023 Impact Factor: 2.9
2023 SCImago Journal Rankings: 0.785
ISI Accession Number ID
WOS:000435546700009

 

DC FieldValueLanguage
dc.contributor.authorLiu, F-
dc.contributor.authorQiu, CG-
dc.contributor.authorZhang, ZY-
dc.contributor.authorPeng, LM-
dc.contributor.authorWang, J-
dc.contributor.authorGuo, H-
dc.date.accessioned2018-07-20T06:33:44Z-
dc.date.available2018-07-20T06:33:44Z-
dc.date.issued2018-
dc.identifier.citationIEEE Transactions on Electron Devices, 2018, v. 65 n. 7, p. 2736-2743-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10722/256379-
dc.languageeng-
dc.publisherIEEE (Institute of Electrical and Electronics Engineers). The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16-
dc.relation.ispartofIEEE Transactions on Electron Devices-
dc.subjectGraphene-
dc.subjectlow power-
dc.subjectMOSFET-
dc.subjectsteep switching-
dc.subjectsubthreshold swing (SS)-
dc.subjecttransition metal dichalcogenides (TMDC)-
dc.titleDirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit-
dc.typeArticle-
dc.identifier.emailLiu, F: feiliu@hku.hk-
dc.identifier.emailWang, J: jianwang@hku.hk-
dc.identifier.emailGuo, H: guohku@hku.hk-
dc.identifier.authorityLiu, F=rp02229-
dc.identifier.authorityWang, J=rp00799-
dc.identifier.doi10.1109/TED.2018.2836387-
dc.identifier.scopuseid_2-s2.0-85047598155-
dc.identifier.hkuros286297-
dc.identifier.volume65-
dc.identifier.issue7-
dc.identifier.spage2736-
dc.identifier.epage2743-
dc.identifier.eissn1557-9646-
dc.identifier.isiWOS:000435546700009-
dc.identifier.issnl0018-9383-

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