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Article: Dirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit

TitleDirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit
Authors
KeywordsGraphene
low power
MOSFET
steep switching
subthreshold swing (SS)
transition metal dichalcogenides (TMDC)
Issue Date2018
PublisherIEEE (Institute of Electrical and Electronics Engineers). The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16
Citation
IEEE Transactions on Electron Devices, 2018, v. 65 n. 7, p. 2736-2743 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/256379
ISSN
2020 Impact Factor: 2.917
2015 SCImago Journal Rankings: 1.436
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLiu, F-
dc.contributor.authorQiu, CG-
dc.contributor.authorZhang, ZY-
dc.contributor.authorPeng, LM-
dc.contributor.authorWang, J-
dc.contributor.authorGuo, H-
dc.date.accessioned2018-07-20T06:33:44Z-
dc.date.available2018-07-20T06:33:44Z-
dc.date.issued2018-
dc.identifier.citationIEEE Transactions on Electron Devices, 2018, v. 65 n. 7, p. 2736-2743-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10722/256379-
dc.languageeng-
dc.publisherIEEE (Institute of Electrical and Electronics Engineers). The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16-
dc.relation.ispartofIEEE Transactions on Electron Devices-
dc.subjectGraphene-
dc.subjectlow power-
dc.subjectMOSFET-
dc.subjectsteep switching-
dc.subjectsubthreshold swing (SS)-
dc.subjecttransition metal dichalcogenides (TMDC)-
dc.titleDirac Electrons at the Source: Breaking the 60-mV/Decade Switching Limit-
dc.typeArticle-
dc.identifier.emailLiu, F: feiliu@hku.hk-
dc.identifier.emailWang, J: jianwang@hku.hk-
dc.identifier.emailGuo, H: guohku@hku.hk-
dc.identifier.authorityLiu, F=rp02229-
dc.identifier.authorityWang, J=rp00799-
dc.identifier.doi10.1109/TED.2018.2836387-
dc.identifier.scopuseid_2-s2.0-85047598155-
dc.identifier.hkuros286297-
dc.identifier.volume65-
dc.identifier.issue7-
dc.identifier.spage2736-
dc.identifier.epage2743-
dc.identifier.eissn1557-9646-
dc.identifier.isiWOS:000435546700009-
dc.identifier.issnl0018-9383-

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