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Article: Terahertz plasmonic high pass filter

TitleTerahertz plasmonic high pass filter
Authors
Issue Date2003
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2003, v. 83 n. 1, p. 201-203 How to Cite?
AbstractTerahertz plasmonic high pass filter was studied. The sharp change of reflection and transmission of electromagnetic waves at plasma frequency made the structure a high pass filter. Fourier transform infrared spectroscopy was used to characterize the reflection response, and a plasma frequency at 0.7 THz was observed.
Persistent Identifierhttp://hdl.handle.net/10722/256877
ISSN
2020 Impact Factor: 3.791
2015 SCImago Journal Rankings: 1.105
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWu, Dongmin-
dc.contributor.authorFang, Nicholas-
dc.contributor.authorSun, Cheng-
dc.contributor.authorZhang, Xiang-
dc.contributor.authorPadilla, Willie J.-
dc.contributor.authorBasov, Dimitri N.-
dc.contributor.authorSmith, David R.-
dc.contributor.authorSchultz, Sheldon-
dc.date.accessioned2018-07-24T08:58:12Z-
dc.date.available2018-07-24T08:58:12Z-
dc.date.issued2003-
dc.identifier.citationApplied Physics Letters, 2003, v. 83 n. 1, p. 201-203-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/256877-
dc.description.abstractTerahertz plasmonic high pass filter was studied. The sharp change of reflection and transmission of electromagnetic waves at plasma frequency made the structure a high pass filter. Fourier transform infrared spectroscopy was used to characterize the reflection response, and a plasma frequency at 0.7 THz was observed.-
dc.languageeng-
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/-
dc.relation.ispartofApplied Physics Letters-
dc.titleTerahertz plasmonic high pass filter-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1063/1.1591083-
dc.identifier.scopuseid_2-s2.0-0041339634-
dc.identifier.volume83-
dc.identifier.issue1-
dc.identifier.spage201-
dc.identifier.epage203-
dc.identifier.isiWOS:000183877800068-
dc.identifier.issnl0003-6951-

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