Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1002/pssb.201900107
- Scopus: eid_2-s2.0-85064452055
- WOS: WOS:000479282900008
- Find via
Supplementary
- Citations:
- Appears in Collections:
Article: Relation between yield stress and Peierls stress
Title | Relation between yield stress and Peierls stress |
---|---|
Authors | |
Keywords | back stress dislocation dynamics simulation dislocations Peierls stress yield stress |
Issue Date | 2019 |
Publisher | Wiley - V C H Verlag GmbH & Co KGaA. The Journal's web site is located at http://www.physica-status-solidi.com |
Citation | Physica Status Solidi B: Basic Research, 2019, v. 256 n. 8, article no. 1900107 How to Cite? |
Abstract | It is often assumed that the Peierls stress of single dislocations can reflect accurately the macroscopic yield stress. Here, dislocation dynamics simulations show that the yield stress‐to‐Peierls stress (Y/P) ratio remains within a small range of ≈0.3 ± 0.1, over a wide range of initial dislocation density, mobile dislocation fraction, and temperature which affects cross slip. This range of Y/P arises from the typical stress concentration ahead of dislocation pile‐ups. The results explain why Y/P was observed to be around one‐third in previous experiments. |
Persistent Identifier | http://hdl.handle.net/10722/277105 |
ISSN | 2023 Impact Factor: 1.5 2023 SCImago Journal Rankings: 0.388 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Siu, KW | - |
dc.contributor.author | Ngan, AHW | - |
dc.date.accessioned | 2019-09-20T08:44:31Z | - |
dc.date.available | 2019-09-20T08:44:31Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Physica Status Solidi B: Basic Research, 2019, v. 256 n. 8, article no. 1900107 | - |
dc.identifier.issn | 0370-1972 | - |
dc.identifier.uri | http://hdl.handle.net/10722/277105 | - |
dc.description.abstract | It is often assumed that the Peierls stress of single dislocations can reflect accurately the macroscopic yield stress. Here, dislocation dynamics simulations show that the yield stress‐to‐Peierls stress (Y/P) ratio remains within a small range of ≈0.3 ± 0.1, over a wide range of initial dislocation density, mobile dislocation fraction, and temperature which affects cross slip. This range of Y/P arises from the typical stress concentration ahead of dislocation pile‐ups. The results explain why Y/P was observed to be around one‐third in previous experiments. | - |
dc.language | eng | - |
dc.publisher | Wiley - V C H Verlag GmbH & Co KGaA. The Journal's web site is located at http://www.physica-status-solidi.com | - |
dc.relation.ispartof | Physica Status Solidi B: Basic Research | - |
dc.rights | This is the peer reviewed version of the following article: Physica Status Solidi B: Basic Research, 2019, v. 256 n. 8, article no. 1900107, which has been published in final form at https://doi.org/10.1002/pssb.201900107. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. | - |
dc.subject | back stress | - |
dc.subject | dislocation dynamics simulation | - |
dc.subject | dislocations | - |
dc.subject | Peierls stress | - |
dc.subject | yield stress | - |
dc.title | Relation between yield stress and Peierls stress | - |
dc.type | Article | - |
dc.identifier.email | Siu, KW: kwkelvin@hku.hk | - |
dc.identifier.email | Ngan, AHW: hwngan@hku.hk | - |
dc.identifier.authority | Ngan, AHW=rp00225 | - |
dc.description.nature | postprint | - |
dc.identifier.doi | 10.1002/pssb.201900107 | - |
dc.identifier.scopus | eid_2-s2.0-85064452055 | - |
dc.identifier.hkuros | 305441 | - |
dc.identifier.volume | 256 | - |
dc.identifier.issue | 8 | - |
dc.identifier.spage | article no. 1900107 | - |
dc.identifier.epage | article no. 1900107 | - |
dc.identifier.isi | WOS:000479282900008 | - |
dc.publisher.place | Germany | - |
dc.identifier.issnl | 0370-1972 | - |