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Article: Reflectometry based on a frequency-shifted interferometer using sideband interference

TitleReflectometry based on a frequency-shifted interferometer using sideband interference
Authors
Issue Date2013
Citation
Optics Letters, 2013, v. 38, n. 7, p. 1083-1085 How to Cite?
AbstractFrequency-shifted interferometry has shown great potential in optical fiber sensor multiplexing. In this letter, we propose and demonstrate a frequency-shifted interferometer (FSI) based on sideband interference. Comparing with previous implementation of FSI based on a Sagnac interferometer, this scheme is much simpler and compact. By scanning the driving frequency of a LiNbO3 phase modulator in the range of 4.5-5.5 GHz, we demonstrate a spatial resolution of 0.1 m, which is 50 times better than the previously reported results. © 2013 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/285707
ISSN
2020 Impact Factor: 3.776
2020 SCImago Journal Rankings: 1.524
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorQi, Bing-
dc.contributor.authorYe, Fei-
dc.contributor.authorQian, Li-
dc.contributor.authorLo, Hoi Kwong-
dc.date.accessioned2020-08-18T04:56:26Z-
dc.date.available2020-08-18T04:56:26Z-
dc.date.issued2013-
dc.identifier.citationOptics Letters, 2013, v. 38, n. 7, p. 1083-1085-
dc.identifier.issn0146-9592-
dc.identifier.urihttp://hdl.handle.net/10722/285707-
dc.description.abstractFrequency-shifted interferometry has shown great potential in optical fiber sensor multiplexing. In this letter, we propose and demonstrate a frequency-shifted interferometer (FSI) based on sideband interference. Comparing with previous implementation of FSI based on a Sagnac interferometer, this scheme is much simpler and compact. By scanning the driving frequency of a LiNbO3 phase modulator in the range of 4.5-5.5 GHz, we demonstrate a spatial resolution of 0.1 m, which is 50 times better than the previously reported results. © 2013 Optical Society of America.-
dc.languageeng-
dc.relation.ispartofOptics Letters-
dc.titleReflectometry based on a frequency-shifted interferometer using sideband interference-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1364/OL.38.001083-
dc.identifier.scopuseid_2-s2.0-84875719032-
dc.identifier.volume38-
dc.identifier.issue7-
dc.identifier.spage1083-
dc.identifier.epage1085-
dc.identifier.eissn1539-4794-
dc.identifier.isiWOS:000316946600026-
dc.identifier.issnl0146-9592-

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