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- Publisher Website: 10.1021/acsami.0c14148
- Scopus: eid_2-s2.0-85092944931
- PMID: 32924414
- WOS: WOS:000582345700088
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Article: On-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging
Title | On-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging |
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Authors | |
Keywords | high-aspect-ratio probe atomic force microscope electrohydrodynamic printing 3D nanoscale topography deep trench |
Issue Date | 2020 |
Publisher | American Chemical Society. The Journal's web site is located at http://pubs.acs.org/journal/aamick |
Citation | ACS Applied Materials & Interfaces, 2020, v. 12 n. 41, p. 46571-46577 How to Cite? |
Abstract | With the growing importance of three-dimensional (3D) nanomaterials and devices, there has been a great demand for high-fidelity, full profile topographic characterizations in a nondestructive manner. A promising route is to employ a high-aspect-ratio (HAR) probe in atomic force microscopy (AFM) imaging. However, the fabrication of HAR-AFM probes continues to suffer from extravagant cost, limited material choice, and complicated manufacturing steps. Here, we report one-step, on-demand electrohydrodynamic 3D printing of metallic HAR-AFM probes with tailored dimensions. Our additive fabrication approach yields a freestanding metallic nanowire with an aspect ratio over 30 directly on a cantilever within tens of seconds, producing a HAR-AFM probe. Furthermore, the benefits associated with unprecedented simplicity in the probe’s dimension control, material selection, and regeneration are provided. The 3D-printed HAR-AFM probe exhibits a better fidelity in deep trench AFM imaging than a standard pyramidal probe. We expect this approach to find facile, material-saving manufacturing routes in particular for customizing functional nanoprobes. |
Persistent Identifier | http://hdl.handle.net/10722/289741 |
ISSN | 2023 Impact Factor: 8.3 2023 SCImago Journal Rankings: 2.058 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | LEE, H | - |
dc.contributor.author | GAN, Z | - |
dc.contributor.author | Chen, M | - |
dc.contributor.author | MIN, S | - |
dc.contributor.author | YANG, J | - |
dc.contributor.author | XU, Z | - |
dc.contributor.author | SHAO, X | - |
dc.contributor.author | Lin, Y | - |
dc.contributor.author | Li, WD | - |
dc.contributor.author | Kim, JT | - |
dc.date.accessioned | 2020-10-22T08:16:48Z | - |
dc.date.available | 2020-10-22T08:16:48Z | - |
dc.date.issued | 2020 | - |
dc.identifier.citation | ACS Applied Materials & Interfaces, 2020, v. 12 n. 41, p. 46571-46577 | - |
dc.identifier.issn | 1944-8244 | - |
dc.identifier.uri | http://hdl.handle.net/10722/289741 | - |
dc.description.abstract | With the growing importance of three-dimensional (3D) nanomaterials and devices, there has been a great demand for high-fidelity, full profile topographic characterizations in a nondestructive manner. A promising route is to employ a high-aspect-ratio (HAR) probe in atomic force microscopy (AFM) imaging. However, the fabrication of HAR-AFM probes continues to suffer from extravagant cost, limited material choice, and complicated manufacturing steps. Here, we report one-step, on-demand electrohydrodynamic 3D printing of metallic HAR-AFM probes with tailored dimensions. Our additive fabrication approach yields a freestanding metallic nanowire with an aspect ratio over 30 directly on a cantilever within tens of seconds, producing a HAR-AFM probe. Furthermore, the benefits associated with unprecedented simplicity in the probe’s dimension control, material selection, and regeneration are provided. The 3D-printed HAR-AFM probe exhibits a better fidelity in deep trench AFM imaging than a standard pyramidal probe. We expect this approach to find facile, material-saving manufacturing routes in particular for customizing functional nanoprobes. | - |
dc.language | eng | - |
dc.publisher | American Chemical Society. The Journal's web site is located at http://pubs.acs.org/journal/aamick | - |
dc.relation.ispartof | ACS Applied Materials & Interfaces | - |
dc.rights | This document is the Accepted Manuscript version of a Published Work that appeared in final form in [JournalTitle], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [insert ACS Articles on Request author-directed link to Published Work, see http://pubs.acs.org/page/policy/articlesonrequest/index.html]. | - |
dc.subject | high-aspect-ratio probe | - |
dc.subject | atomic force microscope | - |
dc.subject | electrohydrodynamic printing | - |
dc.subject | 3D nanoscale topography | - |
dc.subject | deep trench | - |
dc.title | On-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging | - |
dc.type | Article | - |
dc.identifier.email | Chen, M: mjchen@HKUCC-COM.hku.hk | - |
dc.identifier.email | Lin, Y: ylin@hkucc.hku.hk | - |
dc.identifier.email | Li, WD: liwd@hku.hk | - |
dc.identifier.email | Kim, JT: jtkim@hku.hk | - |
dc.identifier.authority | Lin, Y=rp00080 | - |
dc.identifier.authority | Li, WD=rp01581 | - |
dc.identifier.authority | Kim, JT=rp02152 | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1021/acsami.0c14148 | - |
dc.identifier.pmid | 32924414 | - |
dc.identifier.scopus | eid_2-s2.0-85092944931 | - |
dc.identifier.hkuros | 317196 | - |
dc.identifier.volume | 12 | - |
dc.identifier.issue | 41 | - |
dc.identifier.spage | 46571 | - |
dc.identifier.epage | 46577 | - |
dc.identifier.isi | WOS:000582345700088 | - |
dc.publisher.place | United States | - |
dc.identifier.issnl | 1944-8244 | - |