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Article: On-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging

TitleOn-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging
Authors
Keywordshigh-aspect-ratio probe
atomic force microscope
electrohydrodynamic printing
3D nanoscale topography
deep trench
Issue Date2020
PublisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journal/aamick
Citation
ACS Applied Materials & Interfaces, 2020, v. 12 n. 41, p. 46571-46577 How to Cite?
AbstractWith the growing importance of three-dimensional (3D) nanomaterials and devices, there has been a great demand for high-fidelity, full profile topographic characterizations in a nondestructive manner. A promising route is to employ a high-aspect-ratio (HAR) probe in atomic force microscopy (AFM) imaging. However, the fabrication of HAR-AFM probes continues to suffer from extravagant cost, limited material choice, and complicated manufacturing steps. Here, we report one-step, on-demand electrohydrodynamic 3D printing of metallic HAR-AFM probes with tailored dimensions. Our additive fabrication approach yields a freestanding metallic nanowire with an aspect ratio over 30 directly on a cantilever within tens of seconds, producing a HAR-AFM probe. Furthermore, the benefits associated with unprecedented simplicity in the probe’s dimension control, material selection, and regeneration are provided. The 3D-printed HAR-AFM probe exhibits a better fidelity in deep trench AFM imaging than a standard pyramidal probe. We expect this approach to find facile, material-saving manufacturing routes in particular for customizing functional nanoprobes.
Persistent Identifierhttp://hdl.handle.net/10722/289741
ISSN
2019 Impact Factor: 8.758
2015 SCImago Journal Rankings: 2.381
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLEE, H-
dc.contributor.authorGAN, Z-
dc.contributor.authorChen, M-
dc.contributor.authorMIN, S-
dc.contributor.authorYANG, J-
dc.contributor.authorXU, Z-
dc.contributor.authorSHAO, X-
dc.contributor.authorLin, Y-
dc.contributor.authorLi, WD-
dc.contributor.authorKim, JT-
dc.date.accessioned2020-10-22T08:16:48Z-
dc.date.available2020-10-22T08:16:48Z-
dc.date.issued2020-
dc.identifier.citationACS Applied Materials & Interfaces, 2020, v. 12 n. 41, p. 46571-46577-
dc.identifier.issn1944-8244-
dc.identifier.urihttp://hdl.handle.net/10722/289741-
dc.description.abstractWith the growing importance of three-dimensional (3D) nanomaterials and devices, there has been a great demand for high-fidelity, full profile topographic characterizations in a nondestructive manner. A promising route is to employ a high-aspect-ratio (HAR) probe in atomic force microscopy (AFM) imaging. However, the fabrication of HAR-AFM probes continues to suffer from extravagant cost, limited material choice, and complicated manufacturing steps. Here, we report one-step, on-demand electrohydrodynamic 3D printing of metallic HAR-AFM probes with tailored dimensions. Our additive fabrication approach yields a freestanding metallic nanowire with an aspect ratio over 30 directly on a cantilever within tens of seconds, producing a HAR-AFM probe. Furthermore, the benefits associated with unprecedented simplicity in the probe’s dimension control, material selection, and regeneration are provided. The 3D-printed HAR-AFM probe exhibits a better fidelity in deep trench AFM imaging than a standard pyramidal probe. We expect this approach to find facile, material-saving manufacturing routes in particular for customizing functional nanoprobes.-
dc.languageeng-
dc.publisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journal/aamick-
dc.relation.ispartofACS Applied Materials & Interfaces-
dc.rightsThis document is the Accepted Manuscript version of a Published Work that appeared in final form in [JournalTitle], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [insert ACS Articles on Request author-directed link to Published Work, see http://pubs.acs.org/page/policy/articlesonrequest/index.html].-
dc.subjecthigh-aspect-ratio probe-
dc.subjectatomic force microscope-
dc.subjectelectrohydrodynamic printing-
dc.subject3D nanoscale topography-
dc.subjectdeep trench-
dc.titleOn-Demand 3D Printing of Nanowire Probes for High-Aspect-Ratio Atomic Force Microscopy Imaging-
dc.typeArticle-
dc.identifier.emailChen, M: mjchen@HKUCC-COM.hku.hk-
dc.identifier.emailLin, Y: ylin@hkucc.hku.hk-
dc.identifier.emailLi, WD: liwd@hku.hk-
dc.identifier.emailKim, JT: jtkim@hku.hk-
dc.identifier.authorityLin, Y=rp00080-
dc.identifier.authorityLi, WD=rp01581-
dc.identifier.authorityKim, JT=rp02152-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/acsami.0c14148-
dc.identifier.pmid32924414-
dc.identifier.scopuseid_2-s2.0-85092944931-
dc.identifier.hkuros317196-
dc.identifier.volume12-
dc.identifier.issue41-
dc.identifier.spage46571-
dc.identifier.epage46577-
dc.identifier.isiWOS:000582345700088-
dc.publisher.placeUnited States-
dc.identifier.issnl1944-8244-

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