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- Publisher Website: 10.1109/LED.2008.2001123
- Scopus: eid_2-s2.0-48649099958
- WOS: WOS:000258096000014
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Article: On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm
| Title | On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm |
|---|---|
| Authors | |
| Keywords | Nanoinjection Photon detector Jitter Lateral transport |
| Issue Date | 2008 |
| Citation | IEEE Electron Device Letters, 2008, v. 29, n. 8, p. 867-869 How to Cite? |
| Abstract | The transient response of a nanoinjection infrared photon detector was studied by exploring the relation between lateral charge transfer and jitter. The jitter of the device was measured to be 15 ps at room temperature. The jitter was almost independent of the pulse power, even after device saturation. Spatial maps for delay and amplitude were acquired. The carrier velocity was extracted from the measurements and compared with that of the simulation model. The jitter due to transit time was calculated to be in agreement with the measured data, which indicated that the jitter is primarily transit time limited. © 2008 IEEE. |
| Persistent Identifier | http://hdl.handle.net/10722/294944 |
| ISSN | 2023 Impact Factor: 4.1 2023 SCImago Journal Rankings: 1.250 |
| ISI Accession Number ID |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Memis, Omer Gokalp | - |
| dc.contributor.author | Katsnelson, Alex | - |
| dc.contributor.author | Mohseni, Hooman | - |
| dc.contributor.author | Yan, Minjun | - |
| dc.contributor.author | Zhang, Shuang | - |
| dc.contributor.author | Hossain, Tim | - |
| dc.contributor.author | Jin, Niu | - |
| dc.contributor.author | Adesida, Ilesanmi | - |
| dc.date.accessioned | 2021-01-05T04:58:44Z | - |
| dc.date.available | 2021-01-05T04:58:44Z | - |
| dc.date.issued | 2008 | - |
| dc.identifier.citation | IEEE Electron Device Letters, 2008, v. 29, n. 8, p. 867-869 | - |
| dc.identifier.issn | 0741-3106 | - |
| dc.identifier.uri | http://hdl.handle.net/10722/294944 | - |
| dc.description.abstract | The transient response of a nanoinjection infrared photon detector was studied by exploring the relation between lateral charge transfer and jitter. The jitter of the device was measured to be 15 ps at room temperature. The jitter was almost independent of the pulse power, even after device saturation. Spatial maps for delay and amplitude were acquired. The carrier velocity was extracted from the measurements and compared with that of the simulation model. The jitter due to transit time was calculated to be in agreement with the measured data, which indicated that the jitter is primarily transit time limited. © 2008 IEEE. | - |
| dc.language | eng | - |
| dc.relation.ispartof | IEEE Electron Device Letters | - |
| dc.subject | Nanoinjection | - |
| dc.subject | Photon detector | - |
| dc.subject | Jitter | - |
| dc.subject | Lateral transport | - |
| dc.title | On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm | - |
| dc.type | Article | - |
| dc.description.nature | link_to_subscribed_fulltext | - |
| dc.identifier.doi | 10.1109/LED.2008.2001123 | - |
| dc.identifier.scopus | eid_2-s2.0-48649099958 | - |
| dc.identifier.volume | 29 | - |
| dc.identifier.issue | 8 | - |
| dc.identifier.spage | 867 | - |
| dc.identifier.epage | 869 | - |
| dc.identifier.isi | WOS:000258096000014 | - |
| dc.identifier.issnl | 0741-3106 | - |