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Article: On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm

TitleOn the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm
Authors
KeywordsNanoinjection
Photon detector
Jitter
Lateral transport
Issue Date2008
Citation
IEEE Electron Device Letters, 2008, v. 29, n. 8, p. 867-869 How to Cite?
AbstractThe transient response of a nanoinjection infrared photon detector was studied by exploring the relation between lateral charge transfer and jitter. The jitter of the device was measured to be 15 ps at room temperature. The jitter was almost independent of the pulse power, even after device saturation. Spatial maps for delay and amplitude were acquired. The carrier velocity was extracted from the measurements and compared with that of the simulation model. The jitter due to transit time was calculated to be in agreement with the measured data, which indicated that the jitter is primarily transit time limited. © 2008 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/294944
ISSN
2020 Impact Factor: 4.187
2015 SCImago Journal Rankings: 1.791
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorMemis, Omer Gokalp-
dc.contributor.authorKatsnelson, Alex-
dc.contributor.authorMohseni, Hooman-
dc.contributor.authorYan, Minjun-
dc.contributor.authorZhang, Shuang-
dc.contributor.authorHossain, Tim-
dc.contributor.authorJin, Niu-
dc.contributor.authorAdesida, Ilesanmi-
dc.date.accessioned2021-01-05T04:58:44Z-
dc.date.available2021-01-05T04:58:44Z-
dc.date.issued2008-
dc.identifier.citationIEEE Electron Device Letters, 2008, v. 29, n. 8, p. 867-869-
dc.identifier.issn0741-3106-
dc.identifier.urihttp://hdl.handle.net/10722/294944-
dc.description.abstractThe transient response of a nanoinjection infrared photon detector was studied by exploring the relation between lateral charge transfer and jitter. The jitter of the device was measured to be 15 ps at room temperature. The jitter was almost independent of the pulse power, even after device saturation. Spatial maps for delay and amplitude were acquired. The carrier velocity was extracted from the measurements and compared with that of the simulation model. The jitter due to transit time was calculated to be in agreement with the measured data, which indicated that the jitter is primarily transit time limited. © 2008 IEEE.-
dc.languageeng-
dc.relation.ispartofIEEE Electron Device Letters-
dc.subjectNanoinjection-
dc.subjectPhoton detector-
dc.subjectJitter-
dc.subjectLateral transport-
dc.titleOn the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/LED.2008.2001123-
dc.identifier.scopuseid_2-s2.0-48649099958-
dc.identifier.volume29-
dc.identifier.issue8-
dc.identifier.spage867-
dc.identifier.epage869-
dc.identifier.isiWOS:000258096000014-
dc.identifier.issnl0741-3106-

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