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Article: Intrinsic homogeneous linewidth and broadening mechanisms of excitons in monolayer transition metal dichalcogenides

TitleIntrinsic homogeneous linewidth and broadening mechanisms of excitons in monolayer transition metal dichalcogenides
Authors
Issue Date2015
Citation
Nature Communications, 2015, v. 6, article no. 8315 How to Cite?
AbstractThe band-edge optical response of transition metal dichalcogenides, an emerging class of atomically thin semiconductors, is dominated by tightly bound excitons localized at the corners of the Brillouin zone (valley excitons). A fundamental yet unknown property of valley excitons in these materials is the intrinsic homogeneous linewidth, which reflects irreversible quantum dissipation arising from system (exciton) and bath (vacuum and other quasiparticles) interactions and determines the timescale during which excitons can be coherently manipulated. Here we use optical two-dimensional Fourier transform spectroscopy to measure the exciton homogeneous linewidth in monolayer tungsten diselenide (WSe 2). The homogeneous linewidth is found to be nearly two orders of magnitude narrower than the inhomogeneous width at low temperatures. We evaluate quantitatively the role of exciton-exciton and exciton-phonon interactions and population relaxation as linewidth broadening mechanisms. The key insights reported here - strong many-body effects and intrinsically rapid radiative recombination - are expected to be ubiquitous in atomically thin semiconductors.
Persistent Identifierhttp://hdl.handle.net/10722/298132
PubMed Central ID
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorMoody, Galan-
dc.contributor.authorKavir Dass, Chandriker-
dc.contributor.authorHao, Kai-
dc.contributor.authorChen, Chang Hsiao-
dc.contributor.authorLi, Lain Jong-
dc.contributor.authorSingh, Akshay-
dc.contributor.authorTran, Kha-
dc.contributor.authorClark, Genevieve-
dc.contributor.authorXu, Xiaodong-
dc.contributor.authorBerghäuser, Gunnar-
dc.contributor.authorMalic, Ermin-
dc.contributor.authorKnorr, Andreas-
dc.contributor.authorLi, Xiaoqin-
dc.date.accessioned2021-04-08T03:07:45Z-
dc.date.available2021-04-08T03:07:45Z-
dc.date.issued2015-
dc.identifier.citationNature Communications, 2015, v. 6, article no. 8315-
dc.identifier.urihttp://hdl.handle.net/10722/298132-
dc.description.abstractThe band-edge optical response of transition metal dichalcogenides, an emerging class of atomically thin semiconductors, is dominated by tightly bound excitons localized at the corners of the Brillouin zone (valley excitons). A fundamental yet unknown property of valley excitons in these materials is the intrinsic homogeneous linewidth, which reflects irreversible quantum dissipation arising from system (exciton) and bath (vacuum and other quasiparticles) interactions and determines the timescale during which excitons can be coherently manipulated. Here we use optical two-dimensional Fourier transform spectroscopy to measure the exciton homogeneous linewidth in monolayer tungsten diselenide (WSe 2). The homogeneous linewidth is found to be nearly two orders of magnitude narrower than the inhomogeneous width at low temperatures. We evaluate quantitatively the role of exciton-exciton and exciton-phonon interactions and population relaxation as linewidth broadening mechanisms. The key insights reported here - strong many-body effects and intrinsically rapid radiative recombination - are expected to be ubiquitous in atomically thin semiconductors.-
dc.languageeng-
dc.relation.ispartofNature Communications-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleIntrinsic homogeneous linewidth and broadening mechanisms of excitons in monolayer transition metal dichalcogenides-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1038/ncomms9315-
dc.identifier.pmid26382305-
dc.identifier.pmcidPMC4595717-
dc.identifier.scopuseid_2-s2.0-84941881877-
dc.identifier.volume6-
dc.identifier.spagearticle no. 8315-
dc.identifier.epagearticle no. 8315-
dc.identifier.eissn2041-1723-
dc.identifier.isiWOS:000363020300003-
dc.identifier.issnl2041-1723-

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