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Article: Ultrafast Multi-Level Logic Gates with Spin-Valley Coupled Polarization Anisotropy in Monolayer MoS2

TitleUltrafast Multi-Level Logic Gates with Spin-Valley Coupled Polarization Anisotropy in Monolayer MoS<inf>2</inf>
Authors
Issue Date2015
Citation
Scientific Reports, 2015, v. 5, article no. 8289 How to Cite?
AbstractThe inherent valley-contrasting optical selection rules for interband transitions at the K and K′ valleys in monolayer MoS have attracted extensive interest. Carriers in these two valleys can be selectively excited by circularly polarized optical fields. The comprehensive dynamics of spin valley coupled polarization and polarized exciton are completely resolved in this work. Here, we present a systematic study of the ultrafast dynamics of monolayer MoS including spin randomization, exciton dissociation, free carrier relaxation, and electron-hole recombination by helicity- and photon energy-resolved transient spectroscopy. The time constants for these processes are 60 fs, 1 ps, 25 ps, and ∼300 ps, respectively. The ultrafast dynamics of spin polarization, valley population, and exciton dissociation provides the desired information about the mechanism of radiationless transitions in various applications of 2D transition metal dichalcogenides. For example, spin valley coupled polarization provides a promising way to build optically selective-driven ultrafast valleytronics at room temperature. Therefore, a full understanding of the ultrafast dynamics in MoS is expected to provide important fundamental and technological perspectives. 2 2 2
Persistent Identifierhttp://hdl.handle.net/10722/298140
PubMed Central ID
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWang, Yu Ting-
dc.contributor.authorLuo, Chih Wei-
dc.contributor.authorYabushita, Atsushi-
dc.contributor.authorWu, Kaung Hsiung-
dc.contributor.authorKobayashi, Takayoshi-
dc.contributor.authorChen, Chang Hsiao-
dc.contributor.authorLi, Lain Jong-
dc.date.accessioned2021-04-08T03:07:46Z-
dc.date.available2021-04-08T03:07:46Z-
dc.date.issued2015-
dc.identifier.citationScientific Reports, 2015, v. 5, article no. 8289-
dc.identifier.urihttp://hdl.handle.net/10722/298140-
dc.description.abstractThe inherent valley-contrasting optical selection rules for interband transitions at the K and K′ valleys in monolayer MoS have attracted extensive interest. Carriers in these two valleys can be selectively excited by circularly polarized optical fields. The comprehensive dynamics of spin valley coupled polarization and polarized exciton are completely resolved in this work. Here, we present a systematic study of the ultrafast dynamics of monolayer MoS including spin randomization, exciton dissociation, free carrier relaxation, and electron-hole recombination by helicity- and photon energy-resolved transient spectroscopy. The time constants for these processes are 60 fs, 1 ps, 25 ps, and ∼300 ps, respectively. The ultrafast dynamics of spin polarization, valley population, and exciton dissociation provides the desired information about the mechanism of radiationless transitions in various applications of 2D transition metal dichalcogenides. For example, spin valley coupled polarization provides a promising way to build optically selective-driven ultrafast valleytronics at room temperature. Therefore, a full understanding of the ultrafast dynamics in MoS is expected to provide important fundamental and technological perspectives. 2 2 2-
dc.languageeng-
dc.relation.ispartofScientific Reports-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleUltrafast Multi-Level Logic Gates with Spin-Valley Coupled Polarization Anisotropy in Monolayer MoS<inf>2</inf>-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1038/srep08289-
dc.identifier.pmid25656222-
dc.identifier.pmcidPMC4319162-
dc.identifier.scopuseid_2-s2.0-84950261782-
dc.identifier.volume5-
dc.identifier.spagearticle no. 8289-
dc.identifier.epagearticle no. 8289-
dc.identifier.eissn2045-2322-
dc.identifier.isiWOS:000348903900004-
dc.identifier.issnl2045-2322-

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