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Article: Band Alignment of 2D Transition Metal Dichalcogenide Heterojunctions

TitleBand Alignment of 2D Transition Metal Dichalcogenide Heterojunctions
Authors
Keywords2D materials
Anderson's rule
transition metal dichalcogonides
heterojunctions
electron affinity rule
Issue Date2017
Citation
Advanced Functional Materials, 2017, v. 27, n. 19, article no. 1603756 How to Cite?
AbstractIt is critically important to characterize the band alignment in semiconductor heterojunctions (HJs) because it controls the electronic and optical properties. However, the well-known Anderson's model usually fails to predict the band alignment in bulk HJ systems due to the presence of charge transfer at the interfacial bonding. Atomically thin 2D transition metal dichalcogenide materials have attracted much attention recently since the ultrathin HJs and devices can be easily built and they are promising for future electronics. The vertical HJs based on 2D materials can be constructed via van der Waals stacking regardless of the lattice mismatch between two materials. Despite the defect-free characteristics of the junction interface, experimental evidence is still lacking on whether the simple Anderson rule can predict the band alignment of HJs. Here, the validity of Anderson's model is verified for the 2D heterojunction systems and the success of Anderson's model is attributed to the absence of dangling bonds (i.e., interface dipoles) at the van der Waal interface. The results from the work set a foundation allowing the use of powerful Anderson's rule to determine the band alignments of 2D HJs, which is beneficial to future electronic, photonic, and optoelectronic devices.
Persistent Identifierhttp://hdl.handle.net/10722/298172
ISSN
2023 Impact Factor: 18.5
2023 SCImago Journal Rankings: 5.496
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorChiu, Ming Hui-
dc.contributor.authorTseng, Wei Hsuan-
dc.contributor.authorTang, Hao Ling-
dc.contributor.authorChang, Yung Huang-
dc.contributor.authorChen, Chang Hsiao-
dc.contributor.authorHsu, Wei Ting-
dc.contributor.authorChang, Wen Hao-
dc.contributor.authorWu, Chih I.-
dc.contributor.authorLi, Lain Jong-
dc.date.accessioned2021-04-08T03:07:50Z-
dc.date.available2021-04-08T03:07:50Z-
dc.date.issued2017-
dc.identifier.citationAdvanced Functional Materials, 2017, v. 27, n. 19, article no. 1603756-
dc.identifier.issn1616-301X-
dc.identifier.urihttp://hdl.handle.net/10722/298172-
dc.description.abstractIt is critically important to characterize the band alignment in semiconductor heterojunctions (HJs) because it controls the electronic and optical properties. However, the well-known Anderson's model usually fails to predict the band alignment in bulk HJ systems due to the presence of charge transfer at the interfacial bonding. Atomically thin 2D transition metal dichalcogenide materials have attracted much attention recently since the ultrathin HJs and devices can be easily built and they are promising for future electronics. The vertical HJs based on 2D materials can be constructed via van der Waals stacking regardless of the lattice mismatch between two materials. Despite the defect-free characteristics of the junction interface, experimental evidence is still lacking on whether the simple Anderson rule can predict the band alignment of HJs. Here, the validity of Anderson's model is verified for the 2D heterojunction systems and the success of Anderson's model is attributed to the absence of dangling bonds (i.e., interface dipoles) at the van der Waal interface. The results from the work set a foundation allowing the use of powerful Anderson's rule to determine the band alignments of 2D HJs, which is beneficial to future electronic, photonic, and optoelectronic devices.-
dc.languageeng-
dc.relation.ispartofAdvanced Functional Materials-
dc.subject2D materials-
dc.subjectAnderson's rule-
dc.subjecttransition metal dichalcogonides-
dc.subjectheterojunctions-
dc.subjectelectron affinity rule-
dc.titleBand Alignment of 2D Transition Metal Dichalcogenide Heterojunctions-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1002/adfm.201603756-
dc.identifier.scopuseid_2-s2.0-84988344329-
dc.identifier.volume27-
dc.identifier.issue19-
dc.identifier.spagearticle no. 1603756-
dc.identifier.epagearticle no. 1603756-
dc.identifier.eissn1616-3028-
dc.identifier.isiWOS:000401319100010-
dc.identifier.issnl1616-301X-

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