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- Publisher Website: 10.1021/nn503521c
- Scopus: eid_2-s2.0-84906657558
- WOS: WOS:000340992300117
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Article: Role of metal contacts in high-performance phototransistors based on WSe2 monolayers
Title | Role of metal contacts in high-performance phototransistors based on WSe<inf>2</inf> monolayers |
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Authors | |
Keywords | 2D material tungsten diselenide Schottky barrier contact effect photodetector |
Issue Date | 2014 |
Citation | ACS Nano, 2014, v. 8, n. 8, p. 8653-8661 How to Cite? |
Abstract | Phototransistors based on monolayer transition metal dichalcogenides (TMD) have high photosensitivity due to their direct band gap transition. However, there is a lack of understanding of the effect of metal contacts on the performance of atomically thin TMD phototransistors. Here, we fabricate phototransistors based on large-area chemical vapor deposition (CVD) tungsten diselenide (WSe ) monolayers contacted with the metals of different work function values. We found that the low Schottky-contact WSe phototransistors exhibit a very high photo gain (10 ) and specific detectivity (10 Jones), values higher than commercial Si- and InGaAs-based photodetectors; however, the response speed is longer than 5 s in ambient air. In contrast, the high Schottky-contact phototransistors display a fast response time shorter than 23 ms, but the photo gain and specific detectivity decrease by several orders of magnitude. Moreover, the fast response speed of the high Schottky-contact devices is maintained for a few months in ambient air. This study demonstrates that the contact plays an important role in TMD phototransistors, and barrier height tuning is critical for optimizing the photoresponse and photoresponsivity. © 2014 American Chemical Society. 2 2 5 14 |
Persistent Identifier | http://hdl.handle.net/10722/298440 |
ISSN | 2023 Impact Factor: 15.8 2023 SCImago Journal Rankings: 4.593 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Zhang, Wenjing | - |
dc.contributor.author | Chiu, Ming Hui | - |
dc.contributor.author | Chen, Chang Hsiao | - |
dc.contributor.author | Chen, Wei | - |
dc.contributor.author | Li, Lain Jong | - |
dc.contributor.author | Wee, Andrew Thye Shen | - |
dc.date.accessioned | 2021-04-08T03:08:25Z | - |
dc.date.available | 2021-04-08T03:08:25Z | - |
dc.date.issued | 2014 | - |
dc.identifier.citation | ACS Nano, 2014, v. 8, n. 8, p. 8653-8661 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | http://hdl.handle.net/10722/298440 | - |
dc.description.abstract | Phototransistors based on monolayer transition metal dichalcogenides (TMD) have high photosensitivity due to their direct band gap transition. However, there is a lack of understanding of the effect of metal contacts on the performance of atomically thin TMD phototransistors. Here, we fabricate phototransistors based on large-area chemical vapor deposition (CVD) tungsten diselenide (WSe ) monolayers contacted with the metals of different work function values. We found that the low Schottky-contact WSe phototransistors exhibit a very high photo gain (10 ) and specific detectivity (10 Jones), values higher than commercial Si- and InGaAs-based photodetectors; however, the response speed is longer than 5 s in ambient air. In contrast, the high Schottky-contact phototransistors display a fast response time shorter than 23 ms, but the photo gain and specific detectivity decrease by several orders of magnitude. Moreover, the fast response speed of the high Schottky-contact devices is maintained for a few months in ambient air. This study demonstrates that the contact plays an important role in TMD phototransistors, and barrier height tuning is critical for optimizing the photoresponse and photoresponsivity. © 2014 American Chemical Society. 2 2 5 14 | - |
dc.language | eng | - |
dc.relation.ispartof | ACS Nano | - |
dc.subject | 2D material | - |
dc.subject | tungsten diselenide | - |
dc.subject | Schottky barrier | - |
dc.subject | contact effect | - |
dc.subject | photodetector | - |
dc.title | Role of metal contacts in high-performance phototransistors based on WSe<inf>2</inf> monolayers | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1021/nn503521c | - |
dc.identifier.scopus | eid_2-s2.0-84906657558 | - |
dc.identifier.volume | 8 | - |
dc.identifier.issue | 8 | - |
dc.identifier.spage | 8653 | - |
dc.identifier.epage | 8661 | - |
dc.identifier.eissn | 1936-086X | - |
dc.identifier.isi | WOS:000340992300117 | - |
dc.identifier.issnl | 1936-0851 | - |