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Conference Paper: Positron as a Probe for Atomic Scale Vacancy Defects in Semiconductors

TitlePositron as a Probe for Atomic Scale Vacancy Defects in Semiconductors
Authors
Ling, FCC
Issue Date2018
Citation
International Conference on Radiation and Emission in Materials (ICREM-2018), Chiang Mai, Thailand, 20-23 November 2018 How to Cite?
DescriptionInvited talk
Persistent Identifierhttp://hdl.handle.net/10722/300504

 

DC FieldValueLanguage
dc.contributor.authorLing, FCC-
dc.date.accessioned2021-06-18T01:39:17Z-
dc.date.available2021-06-18T01:39:17Z-
dc.date.issued2018-
dc.identifier.citationInternational Conference on Radiation and Emission in Materials (ICREM-2018), Chiang Mai, Thailand, 20-23 November 2018-
dc.identifier.urihttp://hdl.handle.net/10722/300504-
dc.descriptionInvited talk-
dc.languageeng-
dc.relation.ispartofInternational Conference on Radiation and Emission in Materials (ICREM-2018)-
dc.titlePositron as a Probe for Atomic Scale Vacancy Defects in Semiconductors-
dc.typeConference_Paper-
dc.identifier.emailLing, FCC: ccling@hkucc.hku.hk-
dc.identifier.authorityLing, FCC=rp00747-
dc.identifier.hkuros312555-

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