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Article: An edge-on energy-resolved X-ray semiconductor detector

TitleAn edge-on energy-resolved X-ray semiconductor detector
Authors
KeywordsX-ray dector
Edge-on
Issue Date2021
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc
Citation
Solid State Communications, 2021, v. 332, p. article no. 114339 How to Cite?
AbstractThe hyperspectral X-ray imaging has long been sought in various fields from material analysis to medical diagnosis. Here we propose a semiconductor detector structure to realize multi-energy imaging at potentially low cost. The device is designed based on the dramatically energy-dependent attenuation of X-ray in solids. An array or a two-/three-dimensional matrix of semiconductor cells is used to map the X-ray intensity along its trajectory. The X-ray spectrum could be extracted from a Laplace like transform or a regression via supervised machine learning. We conceptually demonstrated an energy-resolved X-ray detection with a regular silicon CMOS camera and a dummy sample of copper wires on top of an aluminum flake. The experiment provides energy-resolved X-ray image of the sample. The demonstration shows an energy resolution of less than 10 keV. We concluded that the proposed edge-on structure is potentially useful as energy-resolved high efficiency low-cost X-ray detectors.
Persistent Identifierhttp://hdl.handle.net/10722/300952
ISSN
2020 Impact Factor: 1.804
2015 SCImago Journal Rankings: 0.776

 

DC FieldValueLanguage
dc.contributor.authorYan, T-
dc.contributor.authorYang, C-
dc.contributor.authorCui, X-
dc.date.accessioned2021-07-06T03:12:31Z-
dc.date.available2021-07-06T03:12:31Z-
dc.date.issued2021-
dc.identifier.citationSolid State Communications, 2021, v. 332, p. article no. 114339-
dc.identifier.issn0038-1098-
dc.identifier.urihttp://hdl.handle.net/10722/300952-
dc.description.abstractThe hyperspectral X-ray imaging has long been sought in various fields from material analysis to medical diagnosis. Here we propose a semiconductor detector structure to realize multi-energy imaging at potentially low cost. The device is designed based on the dramatically energy-dependent attenuation of X-ray in solids. An array or a two-/three-dimensional matrix of semiconductor cells is used to map the X-ray intensity along its trajectory. The X-ray spectrum could be extracted from a Laplace like transform or a regression via supervised machine learning. We conceptually demonstrated an energy-resolved X-ray detection with a regular silicon CMOS camera and a dummy sample of copper wires on top of an aluminum flake. The experiment provides energy-resolved X-ray image of the sample. The demonstration shows an energy resolution of less than 10 keV. We concluded that the proposed edge-on structure is potentially useful as energy-resolved high efficiency low-cost X-ray detectors.-
dc.languageeng-
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc-
dc.relation.ispartofSolid State Communications-
dc.subjectX-ray dector-
dc.subjectEdge-on-
dc.titleAn edge-on energy-resolved X-ray semiconductor detector-
dc.typeArticle-
dc.identifier.emailCui, X: xdcui@hku.hk-
dc.identifier.authorityCui, X=rp00689-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.ssc.2021.114339-
dc.identifier.scopuseid_2-s2.0-85105345963-
dc.identifier.hkuros323113-
dc.identifier.volume332-
dc.identifier.spagearticle no. 114339-
dc.identifier.epagearticle no. 114339-
dc.publisher.placeUnited Kingdom-

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