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Article: PolarMask++: Enhanced Polar Representation for Single-Shot Instance Segmentation and Beyond

TitlePolarMask++: Enhanced Polar Representation for Single-Shot Instance Segmentation and Beyond
Authors
Issue Date2021
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=34
Citation
IEEE Transactions on Pattern Analysis and Machine Intelligence, 2021, Forthcoming How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/301199
ISSN
2023 Impact Factor: 20.8
2023 SCImago Journal Rankings: 6.158

 

DC FieldValueLanguage
dc.contributor.authorXIE, E-
dc.contributor.authorWANG, W-
dc.contributor.authorDING, M-
dc.contributor.authorZHANG, R-
dc.contributor.authorLuo, P-
dc.date.accessioned2021-07-27T08:07:35Z-
dc.date.available2021-07-27T08:07:35Z-
dc.date.issued2021-
dc.identifier.citationIEEE Transactions on Pattern Analysis and Machine Intelligence, 2021, Forthcoming-
dc.identifier.issn0162-8828-
dc.identifier.urihttp://hdl.handle.net/10722/301199-
dc.languageeng-
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=34-
dc.relation.ispartofIEEE Transactions on Pattern Analysis and Machine Intelligence-
dc.rightsIEEE Transactions on Pattern Analysis and Machine Intelligence. Copyright © Institute of Electrical and Electronics Engineers.-
dc.rights©20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titlePolarMask++: Enhanced Polar Representation for Single-Shot Instance Segmentation and Beyond-
dc.typeArticle-
dc.identifier.emailLuo, P: pluo@hku.hk-
dc.identifier.authorityLuo, P=rp02575-
dc.identifier.hkuros323751-
dc.identifier.volumeForthcoming-
dc.publisher.placeUnited States-

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