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- Publisher Website: 10.1016/1359-6454(95)00282-0
- Scopus: eid_2-s2.0-0030150998
- WOS: WOS:A1996UF04600030
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Article: Surface segregation in thin films
Title | Surface segregation in thin films |
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Authors | |
Issue Date | 1996 |
Citation | Acta Materialia, 1996, v. 44, n. 5, p. 2067-2072 How to Cite? |
Abstract | We present a theoretical analysis of the effects of thickness on surface segregation in thin films. This theory predicts surface composition as a function of the heat of segregation, temperature and film thickness. The heat of segregation can be obtained from a bulk measurement. We then present atomistic simulation results for segregation in thin films of different thicknesses and at different temperatures. Our theoretical results show excellent correspondence with the atomistic simulation results for all film thicknesses with no adjustable parameters, other than the bulk heat of segregation. Extensions of the theory to describe multiple layer segregation are outlined. |
Persistent Identifier | http://hdl.handle.net/10722/303147 |
ISSN | 2023 Impact Factor: 8.3 2023 SCImago Journal Rankings: 2.916 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Swaminarayan, S. | - |
dc.contributor.author | Srolovitz, D. J. | - |
dc.date.accessioned | 2021-09-15T08:24:43Z | - |
dc.date.available | 2021-09-15T08:24:43Z | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | Acta Materialia, 1996, v. 44, n. 5, p. 2067-2072 | - |
dc.identifier.issn | 1359-6454 | - |
dc.identifier.uri | http://hdl.handle.net/10722/303147 | - |
dc.description.abstract | We present a theoretical analysis of the effects of thickness on surface segregation in thin films. This theory predicts surface composition as a function of the heat of segregation, temperature and film thickness. The heat of segregation can be obtained from a bulk measurement. We then present atomistic simulation results for segregation in thin films of different thicknesses and at different temperatures. Our theoretical results show excellent correspondence with the atomistic simulation results for all film thicknesses with no adjustable parameters, other than the bulk heat of segregation. Extensions of the theory to describe multiple layer segregation are outlined. | - |
dc.language | eng | - |
dc.relation.ispartof | Acta Materialia | - |
dc.title | Surface segregation in thin films | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/1359-6454(95)00282-0 | - |
dc.identifier.scopus | eid_2-s2.0-0030150998 | - |
dc.identifier.volume | 44 | - |
dc.identifier.issue | 5 | - |
dc.identifier.spage | 2067 | - |
dc.identifier.epage | 2072 | - |
dc.identifier.isi | WOS:A1996UF04600030 | - |