File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Finite element-based model for crack propagation in polycrystalline materials

TitleFinite element-based model for crack propagation in polycrystalline materials
Authors
KeywordsExtended finite element method
Microstructure
Crack discontinuity
Kinetic Monte Carlo
Grain boundaries
Partition of unity
Convergence
Issue Date2004
Citation
Computational and Applied Mathematics, 2004, v. 23, n. 2-3, p. 363-380 How to Cite?
AbstractIn this paper, we use an extended form of the finite element method to study failure in polycrystalline microstructures. Quasi-static crack propagation is conducted using the extended finite element method (X-FEM) and microstructures are simulated using a kinetic Monte Carlo Potts algorithm. In the X-FEM, the framework of partition of unity is used to enrich the classical finite element approximation with a discontinuous function and the two-dimensional asymptotic crack-tip fields. This enables the domain to be modeled by finite elements without explicitly meshing the crack surfaces, and hence crack growth simulations can be carried out without the need for remeshing. First, the convergence of the method for crack problems is studied and its rate of convergence is established. Microstructural calculations are carried out on a regular lattice and a constrained Delaunay triangulation algorithm is used to mesh the microstructure. Fracture properties of the grain boundaries are assumed to be distinct from that of the grain interior, and the maximum energy release rate criterion is invoked to study the competition between intergranular and transgranular modes of crack growth.
Persistent Identifierhttp://hdl.handle.net/10722/303354
ISSN
2023 Impact Factor: 2.5
2023 SCImago Journal Rankings: 0.646
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorSukumar, N.-
dc.contributor.authorSrolovitz, D. J.-
dc.date.accessioned2021-09-15T08:25:08Z-
dc.date.available2021-09-15T08:25:08Z-
dc.date.issued2004-
dc.identifier.citationComputational and Applied Mathematics, 2004, v. 23, n. 2-3, p. 363-380-
dc.identifier.issn2238-3603-
dc.identifier.urihttp://hdl.handle.net/10722/303354-
dc.description.abstractIn this paper, we use an extended form of the finite element method to study failure in polycrystalline microstructures. Quasi-static crack propagation is conducted using the extended finite element method (X-FEM) and microstructures are simulated using a kinetic Monte Carlo Potts algorithm. In the X-FEM, the framework of partition of unity is used to enrich the classical finite element approximation with a discontinuous function and the two-dimensional asymptotic crack-tip fields. This enables the domain to be modeled by finite elements without explicitly meshing the crack surfaces, and hence crack growth simulations can be carried out without the need for remeshing. First, the convergence of the method for crack problems is studied and its rate of convergence is established. Microstructural calculations are carried out on a regular lattice and a constrained Delaunay triangulation algorithm is used to mesh the microstructure. Fracture properties of the grain boundaries are assumed to be distinct from that of the grain interior, and the maximum energy release rate criterion is invoked to study the competition between intergranular and transgranular modes of crack growth.-
dc.languageeng-
dc.relation.ispartofComputational and Applied Mathematics-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.subjectExtended finite element method-
dc.subjectMicrostructure-
dc.subjectCrack discontinuity-
dc.subjectKinetic Monte Carlo-
dc.subjectGrain boundaries-
dc.subjectPartition of unity-
dc.subjectConvergence-
dc.titleFinite element-based model for crack propagation in polycrystalline materials-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1590/s1807-03022004000200014-
dc.identifier.scopuseid_2-s2.0-70450193755-
dc.identifier.volume23-
dc.identifier.issue2-3-
dc.identifier.spage363-
dc.identifier.epage380-
dc.identifier.eissn1807-0302-
dc.identifier.isiWOS:000208135100014-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats